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Author
Habas, P. (12)
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1998
(2)
1997
(5)
1996
(4)
1995
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Conference Proceeding
(7)
Article (peer reviewed)
(4)
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English
(12)
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Fakultät für Ingenieurwissenschaften
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Title
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Author
Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing
(1997)
Seliger, Norbert
;
Habas, P.
;
Pogany, D.
;
Gornik, E.
Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique
(1996)
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique
(1996)
Pogany, D.
;
Seliger, Norbert
;
Lalinsky, T.
;
Kuzmik, J.
;
Habas, P.
;
Hrkut, P.
;
Gornik, E.
Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique
(1998)
Pogany, D.
;
Seliger, Norbert
;
Lalinsky, T.
;
Kuzmik, J.
;
Habas, P.
;
Hrkut, P.
;
Gornik, E.
Power Sensor Microsystems Characterization using a contactless optical laser method
(1996)
Pogany, D.
;
Lalinsky, T.
;
Seliger, Norbert
;
Kuzmik, J.
;
Habas, P.
;
Hrkut, P.
;
Gornik, E.
Optical Testing of submicron-technology MOSFETs and bipolar transistors
(1997)
Pogany, D.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
;
Kubicek, S.
;
Decoutere, S.
Modeling and measurements of backside laserprobe signals in MOSFETs
(1995)
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
Characterisation of Semiconductor Devices by Infrared Laser Interferometry
(1998)
Seliger, Norbert
;
Gornik, E.
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Thalhammer, R.
;
Stoisiek, M.
Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices
(1997)
Seliger, Norbert
;
Fuerboeck, C.
;
Habas, P.
;
Pogany, D.
;
Gornik, E.
Backside laserprobing of transient heating in power VDMOSFETs
(1996)
Seliger, Norbert
;
Habas, P.
;
Koeck, A.
;
Pogany, D.
;
Gornik, E.
1
to
10