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Gornik, E.
(12)
Habas, P.
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Seliger, Norbert
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Pogany, D.
(10)
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(5)
Hrkut, P.
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Study of thermal effects in GaAs micromachined power sensor microsystems by an optical interferometer technique
(1996)
Pogany, D.
;
Seliger, Norbert
;
Lalinsky, T.
;
Kuzmik, J.
;
Habas, P.
;
Hrkut, P.
;
Gornik, E.
Power Sensor Microsystems Characterization using a contactless optical laser method
(1996)
Pogany, D.
;
Lalinsky, T.
;
Seliger, Norbert
;
Kuzmik, J.
;
Habas, P.
;
Hrkut, P.
;
Gornik, E.
Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique
(1998)
Pogany, D.
;
Seliger, Norbert
;
Lalinsky, T.
;
Kuzmik, J.
;
Habas, P.
;
Hrkut, P.
;
Gornik, E.
Optical Testing of submicron-technology MOSFETs and bipolar transistors
(1997)
Pogany, D.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
;
Kubicek, S.
;
Decoutere, S.
Time Domain Characterization of lattice heating in power VDMOSFETs by means of an interferometric laserprobe technique
(1996)
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
Modeling and measurements of backside laserprobe signals in MOSFETs
(1995)
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices
(1997)
Seliger, Norbert
;
Fuerboeck, C.
;
Habas, P.
;
Pogany, D.
;
Gornik, E.
Backside laserprobing of transient heating in power VDMOSFETs
(1996)
Seliger, Norbert
;
Habas, P.
;
Koeck, A.
;
Pogany, D.
;
Gornik, E.
A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry
(1997)
Seliger, Norbert
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Gornik, E.
;
Stoisiek, M.
Characterisation of Semiconductor Devices by Infrared Laser Interferometry
(1998)
Seliger, Norbert
;
Gornik, E.
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Thalhammer, R.
;
Stoisiek, M.
1
to
10