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Author
Fuerboeck, C.
(9)
Gornik, E.
(9)
Seliger, Norbert
(9)
Pogany, D.
(7)
Habas, P.
(5)
Thalhammer, R.
(4)
Wachutka, G.
(3)
Deboy, G.
(2)
Stoisiek, M.
(2)
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(1)
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1998
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1997
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(9)
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Optical Testing of submicron-technology MOSFETs and bipolar transistors
(1997)
Pogany, D.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Habas, P.
;
Gornik, E.
;
Kubicek, S.
;
Decoutere, S.
Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices
(1997)
Seliger, Norbert
;
Fuerboeck, C.
;
Habas, P.
;
Pogany, D.
;
Gornik, E.
A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry
(1997)
Seliger, Norbert
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Gornik, E.
;
Stoisiek, M.
Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik
(1997)
Fuerboeck, C.
;
Thalhammer, R.
;
Seliger, Norbert
;
Pogany, D.
;
Deboy, G.
;
Wachutka, G.
;
Gornik, E.
Characterisation of Semiconductor Devices by Infrared Laser Interferometry
(1998)
Seliger, Norbert
;
Gornik, E.
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Thalhammer, R.
;
Stoisiek, M.
A laser beam method for evaluation of thermal time constant in smart power devices
(1997)
Seliger, Norbert
;
Pogany, D.
;
Fuerboeck, C.
;
Habas, P.
;
Gornik, E.
Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices
(1998)
Fuerboeck, C.
;
Seliger, Norbert
;
Pogany, D.
;
Litzenberger, M.
;
Gornik, E.
;
Stecher, M.
;
Gosser, H.
;
Werner, W.
Internal characterization of IGBTs using the backside laser probing technique - Interpretation of measurement by numerical simulation
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Deboy, G.
;
Gornik, E.
;
Wachutka, G.
Validation and calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques
(1998)
Thalhammer, R.
;
Fuerboeck, C.
;
Seliger, Norbert
;
Gornik, E.
;
Wachutka, G.
1
to
9