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Optical Testing of submicron-technology MOSFETs and bipolar transistors

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Author:D. Pogany, C. Fuerboeck, Norbert SeligerORCiD, P. Habas, E. Gornik, S. Kubicek, S. Decoutere
URL:https://ieeexplore.ieee.org/document/1503373
Parent Title (English):European Solid-State Device Research Conference (ESSDERC' 97)
Editor:H. Grünbacher
Document Type:Conference Proceeding
Language:English
Publication Year:1997
Page Number:4
First Page:372
Last Page:375
faculties / departments:Fakultät für Ingenieurwissenschaften