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Characterisation of Semiconductor Devices by Infrared Laser Interferometry (1998)

Seliger, Norbert ; Gornik, E. ; Pogany, D. ; Fuerboeck, C. ; Habas, P. ; Thalhammer, R. ; Stoisiek, M.

Study of Thermal Effects in GaAs Micromachined Power Sensor Microsystems by an Optical Interferometer Technique (1998)

Pogany, D. ; Seliger, Norbert ; Lalinsky, T. ; Kuzmik, J. ; Habas, P. ; Hrkut, P. ; Gornik, E.

Thermal Simulation and characterization of GaAs micromachined power sensor microsystems (1997)

Burian, E. ; Pogany, D. ; Lalinsky, T. ; Seliger, Norbert ; Gornik, E.

Lokale Temperaturbestimmung in Insulated Gate Bipolar Transistoren (IGBTs) mittels Lasersondentechnik (1997)

Fuerboeck, C. ; Thalhammer, R. ; Seliger, Norbert ; Pogany, D. ; Deboy, G. ; Wachutka, G. ; Gornik, E.

A laser beam method for evaluation of thermal time constant in smart power devices (1997)

Seliger, Norbert ; Pogany, D. ; Fuerboeck, C. ; Habas, P. ; Gornik, E.

Optical Testing of submicron-technology MOSFETs and bipolar transistors (1997)

Pogany, D. ; Fuerboeck, C. ; Seliger, Norbert ; Habas, P. ; Gornik, E. ; Kubicek, S. ; Decoutere, S.

A study of temperature distribution in SOI-smart power devices in transient conditions by optical interferometry (1997)

Seliger, Norbert ; Pogany, D. ; Fuerboeck, C. ; Habas, P. ; Gornik, E. ; Stoisiek, M.

Backside-Laserprober Technique for Characterisation of Semiconductor Power Devices (1997)

Seliger, Norbert ; Fuerboeck, C. ; Habas, P. ; Pogany, D. ; Gornik, E.

Time-Resolved Analysis of Self-Heating in Power VDMOSFETs Using Backside-Laserprobing (1997)

Seliger, Norbert ; Habas, P. ; Pogany, D. ; Gornik, E.

Backside laserprober characterization of thermal effects during high current stress in smart power ESD protection devices (1998)

Fuerboeck, C. ; Seliger, Norbert ; Pogany, D. ; Litzenberger, M. ; Gornik, E. ; Stecher, M. ; Gosser, H. ; Werner, W.

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