In situ atomic force microscopy (AFM) analysis of materials under combined corrosive and mechanical load

  • In service, most materials are operated under simultaneous corrosive and mechanical load and there are very few methods capable for testing material degradation under these conditions, especially when it comes to high resolution analysis. For this purpose, in this work, a tensile module capable of uniaxial stretching and compression with up to 5 kN force was integrated into an AFM stage. The elimination of the need for sample unmounting and remounting and the resulting possibility of keeping the sample under constant mechanical load during AFM measurements not only enables a precise positioning of the area of interest but also allows for the analysis of processes in the elastic deformation regime. This methodology was demonstrated for two case studies. Scanning Kelvin Probe Force Microscopy (SKPFM) was used as the main tool to characterize the deformation behavior. Moreover, a flexible electrochemical measurement cell was used to enable electrochemical analysis by means ofIn service, most materials are operated under simultaneous corrosive and mechanical load and there are very few methods capable for testing material degradation under these conditions, especially when it comes to high resolution analysis. For this purpose, in this work, a tensile module capable of uniaxial stretching and compression with up to 5 kN force was integrated into an AFM stage. The elimination of the need for sample unmounting and remounting and the resulting possibility of keeping the sample under constant mechanical load during AFM measurements not only enables a precise positioning of the area of interest but also allows for the analysis of processes in the elastic deformation regime. This methodology was demonstrated for two case studies. Scanning Kelvin Probe Force Microscopy (SKPFM) was used as the main tool to characterize the deformation behavior. Moreover, a flexible electrochemical measurement cell was used to enable electrochemical analysis by means of electrochemical impedance spectroscopy (EIS) and Linear Sweep Voltammetry (LSV) during AFM measurements at different levels of strain. The in situ AFM results are complemented by microstructure analysis by means of electron backscatter diffraction (EBSD). In the first case study, the deformation induced delamination of a thin organic coating on AA2024 T3 aluminium alloy was investigated as a function of alloy surface treatment. The formation of cracks in the insulating passive film enabled an early detection of deformation processes by means of SKPFM. The second case study focused on the comparison of corrosion and deformation behavior of conventional and additively manufactured 316 stainless steels. In comparison to the conventional 316 stainless steel, the effect of processing was clearly detectable on the additively manufactured material as zones of inhomogeneous potential, which also affected the initiation of local corrosion processes. The contribution will provide detailed information on the new AFM setup and summarize our results from both case studies.zeige mehrzeige weniger

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Metadaten
Autor*innen:Özlem Özcan Sandikcioglu
Koautor*innen:Julia Witt, Marina Fernandes Jamar, Daniel Stepien
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2019
Organisationseinheit der BAM:6 Materialchemie
6 Materialchemie / 6.2 Material- und Oberflächentechnologien
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Atomic Force Microscopy (AFM); Corrosion; Coupled corrosive and mechanial load
Themenfelder/Aktivitätsfelder der BAM:Material
Material / Degradation von Werkstoffen
Veranstaltung:EuroCorr2019
Veranstaltungsort:Sevilla, Spain
Beginndatum der Veranstaltung:09.09.2019
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:06.02.2020
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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