Determining thickness and completeness of the shell for polymer core shell nanoparticles by XPS, ToF SIMS and T SEM

  • Core-shell nanoparticles (CSNPs) have become indispensable in various industrial applications. However, their real internal structure usually deviates from an ideal core-shell structure. To control how the particles perform with regard to their specific applications, characterization techniques are required that can distinguish an ideal from a non-ideal morphology. In this work, we investigated PTFE-PMMA (four samples) and PTFE-PS (six samples) polymer CSNPs with constant core diameter (45 nm) but varying shell thickness (4-50 nm). As confirmed by transmission scanning electron microscopy (T-SEM), the shell completely covers the core for the PTFE-PMMA nanoparticles, while the encapsulation of the core by the shell material is incomplete for the PTFE-PS nanoparticles. X-ray photoelectron spectroscopy (XPS) was applied to determine the shell thickness of the nanoparticles. The software SESSA V2.0 was used to analyze the intensities of the elastic peaks and the QUASES software package toCore-shell nanoparticles (CSNPs) have become indispensable in various industrial applications. However, their real internal structure usually deviates from an ideal core-shell structure. To control how the particles perform with regard to their specific applications, characterization techniques are required that can distinguish an ideal from a non-ideal morphology. In this work, we investigated PTFE-PMMA (four samples) and PTFE-PS (six samples) polymer CSNPs with constant core diameter (45 nm) but varying shell thickness (4-50 nm). As confirmed by transmission scanning electron microscopy (T-SEM), the shell completely covers the core for the PTFE-PMMA nanoparticles, while the encapsulation of the core by the shell material is incomplete for the PTFE-PS nanoparticles. X-ray photoelectron spectroscopy (XPS) was applied to determine the shell thickness of the nanoparticles. The software SESSA V2.0 was used to analyze the intensities of the elastic peaks and the QUASES software package to evaluate the shape of the inelastic background in the XPS Survey spectra. For the first time, nanoparticle shell thicknesses are presented which are exclusively based on the analysis of the XPS inelastic background. Furthermore, principal component analysis (PCA) assisted time-of-flight secondary ion mass spectrometry (ToF-SIMS) of the PTFE-PS nanoparticle sample set revealed a systematic variation among the samples and, thus, confirmed the incomplete encapsulation of the core by the shell material. Opposed to that, no variation is observed in the PCA scores plots of the PTFE-PMMA nanoparticle sample set. Consequently, the complete coverage of the core by the shell material is proved by ToF-SIMS with a certainty that cannot be achieved by XPS and T-SEM.zeige mehrzeige weniger

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Metadaten
Autor*innen:Anja MüllerORCiD
Koautor*innen:Thomas Heinrich, S. Tougaard, W. S. M. Werner, M. Hronek, Valentin Kunz, Sigrid Benemann, Vasile-Dan Hodoroaba, Jörg Radnik, Jörg M. Stockmann, Nithiya Nirmalananthan-Budau, Daniel Geißler, K. Sparnacci, Wolfgang Unger
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2019
Organisationseinheit der BAM:6 Materialchemie
6 Materialchemie / 6.1 Oberflächen- und Dünnschichtanalyse
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Core-shell nanoparticles; Polymers; ToF-SIMS; XPS; XPS background analysis
Themenfelder/Aktivitätsfelder der BAM:Chemie und Prozesstechnik
Veranstaltung:18th European Conference on Applications of Surface and Interface Analysis (ECASIA)
Veranstaltungsort:Dresden, Germany
Beginndatum der Veranstaltung:15.09.2019
Enddatum der Veranstaltung:20.09.2019
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:02.10.2019
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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