Electromagnetic testing for additive manufacturing
- This talk presents a new application for high-spatial resolution eddy current testing (ET) with magneto resistive (MR) sensor arrays. With rising popularity and availability of additive manufacturing (AM), companies mainly in the aerospace sector, set high requirements on quality control of AM parts, especially produced with selective laser melting (SLM). Since it was shown that those parts are prawn to flaws like pores or cracks, every part needs to be tested. Therefore, NDT Methods, like ET, could help to characterize SLM parts. Research on ET has shown, that offline ET with high spatial resolution MR sensor arrays is possible and that flaws as small as 50 µm could be detected while significantly reducing testing time. In this talk a first approach on automated online ET method for testing SLM parts is proposed. An approach with hundreds of MR sensor is made to maintain spatial resolution and short testing times. Classic signal conditioning methods are used to reduce cost andThis talk presents a new application for high-spatial resolution eddy current testing (ET) with magneto resistive (MR) sensor arrays. With rising popularity and availability of additive manufacturing (AM), companies mainly in the aerospace sector, set high requirements on quality control of AM parts, especially produced with selective laser melting (SLM). Since it was shown that those parts are prawn to flaws like pores or cracks, every part needs to be tested. Therefore, NDT Methods, like ET, could help to characterize SLM parts. Research on ET has shown, that offline ET with high spatial resolution MR sensor arrays is possible and that flaws as small as 50 µm could be detected while significantly reducing testing time. In this talk a first approach on automated online ET method for testing SLM parts is proposed. An approach with hundreds of MR sensor is made to maintain spatial resolution and short testing times. Classic signal conditioning methods are used to reduce cost and complexity while maintaining high testing bandwidths. The proposed idea enables further research on automated generation of testing reports, process control or automated flaw curing.…