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Chemical and topographical analyses of ps-laser generated HSFL on titanium alloy

  • Laser-induced periodic surface structures (LIPSS) enable a large variety of different surface functionalizations for applications in the fields of optics, fluidics, tribology, or medicine. Moreover, high spatial frequency LIPSS (HSFL) provide an appealing and straightforward way for the generation of surface nanostructures featuring spatial periods even below 100 nm – far beyond the optical diffraction limit. However, the imposed surface functionalities are usually caused by both, topographic and chemical surface alterations. For exploring these effects in detail, multi-method characterization was performed here for HSFL processed on Ti-6Al-4V alloy upon irradiation with near-infrared ps-laser pulses (1030 nm wavelength, ~1 ps pulse duration, 1 – 400 kHz pulse repetition rate) under different scan processing conditions. The subsequent sample characterization involved morphological and topographical investigations by scanning electron microscopy (SEM), atomic force microscopy (AFM),Laser-induced periodic surface structures (LIPSS) enable a large variety of different surface functionalizations for applications in the fields of optics, fluidics, tribology, or medicine. Moreover, high spatial frequency LIPSS (HSFL) provide an appealing and straightforward way for the generation of surface nanostructures featuring spatial periods even below 100 nm – far beyond the optical diffraction limit. However, the imposed surface functionalities are usually caused by both, topographic and chemical surface alterations. For exploring these effects in detail, multi-method characterization was performed here for HSFL processed on Ti-6Al-4V alloy upon irradiation with near-infrared ps-laser pulses (1030 nm wavelength, ~1 ps pulse duration, 1 – 400 kHz pulse repetition rate) under different scan processing conditions. The subsequent sample characterization involved morphological and topographical investigations by scanning electron microscopy (SEM), atomic force microscopy (AFM), stylus profilometry (SP), as well as near-surface chemical analyses by X-ray photoelectron spectroscopy (XPS), hard X-ray photoelectron spectroscopy (HAXPES) and depth-profiling time-of-flight secondary ion mass spectrometry (TOF-SIMS). The results allow to qualify the laser ablation depth, the geometrical HSFL characteristics and provide detailed insights into the depth extent and the nature of the ps-laser-induced near-surface oxidation arising from the laser-processing in ambient air and into the relevance of heat-accumulation effects at high pulse repetition rates. Moreover, the direct comparison of the HAXPES and XPS data reveals the role of surface-covering organic contaminants adsorbed from the ambient atmosphere without ion-sputter depth profiling. Furthermore, reduction of the oxides by sputtering can be avoided.zeige mehrzeige weniger

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Autor*innen:Jörn BonseORCiD
Koautor*innen:Xenia Knigge, Kai Müller, Francesca Mirabella, Mario Sahre, Matthias Weise, Heike Voss, Andreas Hertwig, Karsten Wasmuth, Marek Mezera, Jörg Krüger, Jörg Radnik, Vasile-Dan Hodoroaba
Dokumenttyp:Posterpräsentation
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2024
Organisationseinheit der BAM:6 Materialchemie
6 Materialchemie / 6.1 Oberflächen- und Dünnschichtanalyse
6 Materialchemie / 6.2 Material- und Oberflächentechnologien
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Chemical analyses; Laser-induced periodic surface structures (LIPSS); Nanostructures; Ultrafast laser processing
Themenfelder/Aktivitätsfelder der BAM:Material
Material / Nano
Veranstaltung:SPIE Photonics Europe 2024 Conference, Symposium "Lasers and Photonics for Advanced Manufacturing"
Veranstaltungsort:Strasbourg, France
Beginndatum der Veranstaltung:07.04.2024
Enddatum der Veranstaltung:11.04.2024
URL:https://spie.org/photonics-europe/presentation/Chemical-and-topographical-analyses-of-ps-laser-generated-high-spatial/13005-69#_=_
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:18.04.2024
Referierte Publikation:Nein
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