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Quantification of rock structures with high resolution X-Ray μ-CT for laboratory SIP measurements

  • Spectral Induced Polarization (SIP) measurements are used in many different ways to characterize natural rocks and soils. Main foci of interest are the enhanced characterization of the causes of IP-effects in clastic rocks (especially sandstones), the interactions between the matrix-fluid-system and within the electrical double layers as well as the correlation with “classical” petrophysical parameters, such as specific surface area, permeability, mercury intrusion capillary pressure (MICP) and others. Nevertheless, for all of these investigations, knowledge of the inner structure of the sample material is essential in order to create reliable and validated models as well as to interpret and to assess the data most completely. Unfortunately, many of the methods used, to get access to the inner structure of rocks are destructive (e.g. MICP, thin sectioning, etc.) and the valuable sample is lost. In addition, data is either of volume integrated nature or only available for the 2D caseSpectral Induced Polarization (SIP) measurements are used in many different ways to characterize natural rocks and soils. Main foci of interest are the enhanced characterization of the causes of IP-effects in clastic rocks (especially sandstones), the interactions between the matrix-fluid-system and within the electrical double layers as well as the correlation with “classical” petrophysical parameters, such as specific surface area, permeability, mercury intrusion capillary pressure (MICP) and others. Nevertheless, for all of these investigations, knowledge of the inner structure of the sample material is essential in order to create reliable and validated models as well as to interpret and to assess the data most completely. Unfortunately, many of the methods used, to get access to the inner structure of rocks are destructive (e.g. MICP, thin sectioning, etc.) and the valuable sample is lost. In addition, data is either of volume integrated nature or only available for the 2D case and the usage of sister cores does not necessarily lead to reliable results. In this paper, the authors showcase the possibilities of non-destructive and three dimensional X-ray computed tomography and of enhanced image analysis capabilities for the quantification of rock structures at the pore scale.zeige mehrzeige weniger

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  • IP2016_Aarhus_Praesentation.pdf
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Metadaten
Autor*innen:M. Halisch
Koautor*innen:Sabine KruschwitzORCiD, M. Schmitt, Andreas Weller
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2016
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Digital image analysis; Grain geometry; Pore geometry; Rock structure; SIP; μ-CT imaging
Veranstaltung:IP Workshop 2016
Veranstaltungsort:Aarhus, Denmark
Beginndatum der Veranstaltung:06.06.2016
Enddatum der Veranstaltung:08.06.2016
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:01.08.2016
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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