Tracing fluorine at the surface and in the bulk of TiO2 nanoplatelets by means of SEM-EDX, AES and ToF-SIMS
- The synthesis of TiO2 nanoplatelets with fluorine-containing reactants is carried out using titanium (IV) butoxide as precursor and concentrated HF as shape controller, the final product requires a working up in order to eliminate or at least to reduce the amount of residual fluorides, which is realized here by well-defined thermal treatment of the samples. Bulk and surface sensitive methods namely scanning electron microscopy with energydispersive X-ray spectroscopy (SEM-EDX), Auger electron spectroscopy (AES) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been applied to trace the presence of any fluorides in dependence on different information depths and measurement sensitivities of these methods.
MetadatenAutor*innen: | Steffi Rades |
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Koautor*innen: | Erik Ortel, Thomas Wirth, Markus Holzweber, F. Pellegrino, G. Martra, Vasile-Dan Hodoroaba |
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Dokumenttyp: | Posterpräsentation |
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Veröffentlichungsform: | Präsentation |
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Sprache: | Englisch |
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Jahr der Erstveröffentlichung: | 2017 |
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DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
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Freie Schlagwörter: | AES; Nanoparticles; SEM-EDX; Surface analysis; ToF-SIMS |
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Veranstaltung: | EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting |
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Veranstaltungsort: | Konstanz, Germany |
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Beginndatum der Veranstaltung: | 07.05.2017 |
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Enddatum der Veranstaltung: | 11.05.2017 |
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Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
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Datum der Freischaltung: | 16.05.2017 |
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Referierte Publikation: | Nein |
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