Reliability of high temperature inverters for HEV
Author: | F. Renken, G. Ehbauer, V. Karrer, R. Knorr, S. Ramminger, Norbert SeligerORCiD, E. Wolfgang |
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DOI: | https://doi.org/10.1109/PCCON.2007.373022 |
Parent Title (English): | Proceedings Power Conversion Conference |
Publisher: | IEEE |
Place of publication: | Nagoya |
Document Type: | Conference Proceeding |
Language: | English |
Publication Year: | 2007 |
Tag: | HEV; High-Temperature Electronics; Reliability |
First Page: | 563 |
Last Page: | 568 |
Peer reviewed: | Ja |
faculties / departments: | Fakultät für Ingenieurwissenschaften |
Dewey Decimal Classification: | 6 Technik, Medizin, angewandte Wissenschaften / 60 Technik / 600 Technik, Technologie |