A laser beam method for evaluation of thermal time constant in smart power devices
Author: | Norbert SeligerORCiD, D. Pogany, C. Fuerboeck, P. Habas, E. Gornik |
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DOI: | https://doi.org/10.1016/S0026-2714(97)00149-2 |
Parent Title (English): | Microelectronics Reliability |
Document Type: | Article (peer reviewed) |
Language: | English |
Publication Year: | 1997 |
Volume: | 37 |
Issue: | 10/11 |
Page Number: | 4 |
First Page: | 1727 |
Last Page: | 1730 |
faculties / departments: | Fakultät für Ingenieurwissenschaften |