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Development of low-density coatings for soft x-ray reflectivity enhancement for ATHENA and other missions

  • Metallic coatings made of precious metals (e.g. Ir, Pt or Au) with high atomic number Z have been traditionally employed at grazing incidence for X-rays reflection and focalization. These materials offer a range of reflection extended to higher energies, but also present a series of absorption edges, which limit the reflectivity in the 2-4 keV band and below. Therefore the search for alternative coatings, able to improve the reflection in the soft energy range, is particularly relevant for the development of future telescopes, like ATHENA (ESA), Lynx (NASA) and eXTP (CAS). Low-Z overcoatings (e.g. carbon or B4C), applied on top of the high-Z metallic layer, can enhance the reflectivity in the softer band (mainly below 2 keV), but conventional deposition methods for these materials are not easily compatible with some of the mainstream technologies for mirror fabrication (notably, the silicon pore optics that will be used for the ATHENA X-ray mission which is being implemented by ESA). In this work we discuss novel solutions (carbon-like overcoatings realized by dip coating or vapor phase deposition), which can be particularly convenient for the application to ATHENA and to future telescopes.
Metadaten
Author:Vincenzo Cotroneo, Ricardo Bruni, Thorsten DöhringORCiD, Desiree Ferreira, Eugenio Gibertini, Peter Henriksen, Luca Magagnin, Sonny Massahi, Giovanni Pareschi, Suzanne Romaine, Leandra Sethares, Giorgia Sironi, Daniele Spiga, Gianpiero Tagliaferri, Giuseppe Valsecchi
DOI:https://doi.org/https://doi.org/10.1117/12.2599803
Parent Title (English):Proceedings of SPIE
Publisher:SPIE
Document Type:Conference Proceeding
Language:English
Year of Completion:2021
Creating Corporation:Osservatorio Astronomico di Brera
Contributing Corporation:TH Aschaffenburg
Release Date:2021/06/21
Tag:ATHENA; X-ray; iridium; optics; reflectivity
GND Keyword:Röntgenteleskop
Volume:2021
Issue:11852
Page Number:13
First Page:118524P-1
Last Page:118524P-13
Urheberrecht:1
research focus :Materials / Innovative Material Processing
Materials / Material Testing & Sensor Technology
Licence (German):Keine Lizenz - es gilt das deutsche Urheberrecht
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