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Photon counting and energy discriminating x-ray detectors - benefits and applications

  • Since a few years the direct detection of X-ray photons into electrical signals is possible by usage of highly absorbing photo conducting materials (e.g. CdTe) as detection layer of an underlying CMOS semiconductor X-ray detector. Even NDT energies up to 400 keV are possible today, as well. The image sharpness and absorption efficiency is improved by the replacement of the unsharp scintillation layer (as used at indirect detecting detectors) by a photo conducting layer of much higher thickness. If the read-out speed is high enough (ca. 50 – 100 ns dead time) single X-ray photons can be counted and their energy measured. Read-out noise and dark image correction can be avoided. By setting energy thresholds selected energy ranges of the X-ray spectrum can be detected or suppressed. This allows material discrimination by dual-energy techniques or the reduction of image contributions of scattered radiation, which results in an enhanced contrast sensitivity. To use these advantages in anSince a few years the direct detection of X-ray photons into electrical signals is possible by usage of highly absorbing photo conducting materials (e.g. CdTe) as detection layer of an underlying CMOS semiconductor X-ray detector. Even NDT energies up to 400 keV are possible today, as well. The image sharpness and absorption efficiency is improved by the replacement of the unsharp scintillation layer (as used at indirect detecting detectors) by a photo conducting layer of much higher thickness. If the read-out speed is high enough (ca. 50 – 100 ns dead time) single X-ray photons can be counted and their energy measured. Read-out noise and dark image correction can be avoided. By setting energy thresholds selected energy ranges of the X-ray spectrum can be detected or suppressed. This allows material discrimination by dual-energy techniques or the reduction of image contributions of scattered radiation, which results in an enhanced contrast sensitivity. To use these advantages in an effective way, a special calibration procedure has to be developed, which considers also time dependent processes in the detection layer. This contribution presents some of these new properties of direct detecting digital detector arrays (DDAs) and shows first results on testing fiber reinforced composites as well as first approaches to dual energy imaging.zeige mehrzeige weniger

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Metadaten
Autor*innen:David Schumacher, Uwe ZscherpelORCiD, Uwe Ewert
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Graue Literatur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):19th World Conference on Non-Destructive Testing, 2016, Proceedings
Jahr der Erstveröffentlichung:2016
Veröffentlichende Institution:Bundesanstalt für Materialforschung und -prüfung (BAM)
Herausgeber (Institution):DGZfP
Jahrgang/Band:2016 / 158
Erste Seite:Tu.2.B.5
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:CFRP; Photon counting detectors; dual-energy; laminography
Veranstaltung:19th World Conference on Non-Destructive Testing, 2016
Veranstaltungsort:Munich, Germany
Beginndatum der Veranstaltung:13.06.2016
Enddatum der Veranstaltung:17.06.2016
URN:urn:nbn:de:kobv:b43-365744
ISBN:978-3-940283-78-8
Bemerkung:
Geburtsname von Schumacher, David: Walter, D.
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Birth name of Schumacher, David: Walter, D.
Verfügbarkeit des Dokuments:Datei für die Öffentlichkeit verfügbar ("Open Access")
Lizenz (Deutsch):License LogoCreative Commons - Namensnennung-Keine Bearbeitung
Datum der Freischaltung:21.06.2016
Referierte Publikation:Nein
Schriftenreihen ohne Nummerierung:Wissenschaftliche Artikel der BAM
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