DRAM Failure Analysis and Defect Localization Techniques
| Author: | Martin Versen |
|---|---|
| ISBN: | 978-1-62708-247-1 |
| Parent Title (English): | Microelectronics Failure Analysis, Desk Reference |
| Publisher: | ASM International |
| Place of publication: | Ohio |
| Editor: | Tejinder Gandhi |
| Document Type: | Part of a Book |
| Language: | English |
| Publication Year: | 2019 |
| Tag: | Failure Analysis |
| Edition: | Seventh Edition |
| First Page: | 499 |
| Last Page: | 505 |
| faculties / departments: | Fakultät für Ingenieurwissenschaften |
