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The BAMline at the synchrotron X-ray source BESSY II (Berlin, Germany) is supporting researchers especially in materials science. As a non-destructive characterization method, synchrotron X-ray imaging, especially tomography with hard X-Rays, plays an important role in structural 3D characterization. The imaging capabilities allow for in-situ and operando experiments. In this presentation the data handling pipeline is presented.
The hard X-ray beamline BAMline at BESSY II (Berlin, Germany) has now been in service for 20 years. Several improvements have been implemented in this time, and this review provides an overview of the imaging methods available at the BAMline. Besides classic full-field synchrotron X-ray computed tomography (SXCT), also absorption edge CT, synchrotron X-ray refraction radiography (SXRR), and synchrotron X-ray refraction tomography (SXRCT) are used for imaging. Moreover, virtually any of those techniques are currently coupled in situ or operando with ancillary equipment such as load rigs, furnaces, or potentiostats. Each of the available techniques is explained and both the current and the potential usage are described with corresponding examples. The potential use is manifold, the examples cover organic materials, composite materials, energy-related materials, biological samples, and materials related to additive manufacturing. The article includes published examples as well as some unpublished applications.
A recent upgrade of key equipment of the BAMline widens its imaging capabilities: shorter scan acquisition times are now possible, in situ and operando studies can now be routinely performed, and different energy spectra can easily be set up. In fact, the upgraded double-multilayer monochromator brings full flexibility by yielding different energy spectra to optimize flux and energy resolution as desired.
The BAMline at the synchrotron X-ray source BESSY II (Berlin, Germany) is supporting researchers in a wide range of research areas since more than 20 years. These fields include biology, cultural heritage, medicine, and also materials science. As a non-destructive characterization method, synchrotron X-ray imaging, especially tomography with hard X-Rays, plays an important role in structural 3D characterization. A recent upgrade of key equipment at the BAMline expands the imaging capabilities towards shorter acquisition times. Therefore, in-situ and operando experiments can now be routinely conducted. Also, different energy resolutions can be set up to optimize flux and energy resolution as desired. This requires an adaptation of the used reconstruction methods in order to perform necessary analyses also during the experiment. In this presentation the equipment, data handling pipeline as well as various examples from material science are presented.
The BAMline at the 3rd generation synchrotron X-ray source BESSY II has been supporting researchers in a wide range of research areas for over 20 years. In addition to materials science, these fields also include biology, cultural heritage, and medicine. Being a non-destructive characterization method, synchrotron X-ray imaging, in particular tomography (SXCT), plays a particularly important role in structural characterization. A recent upgrade of key BAMline equipment expands the imaging capabilities: The upgraded dual multilayer monochromator offers flexibility by providing different energy spectra to optimize flux and energy resolution as desired. Different spectra (8 – 60 keV with ΔE/E 0.01%, 1.5%, 4% and pink beam) can be selected. The upgraded detector (in white beam configuration, equipped with an sCMOS camera) allows the higher flux to be exploited with reduced readout times. Shorter tomographic acquisition times in the range of seconds are now possible. Hence, in-situ and operando examinations are routinely available. An integrated slip ring allows continuous rotation of the sample stage for ease of wiring. The pink beam option allows tomographic observation of processes occurring in the time domain of a few seconds with a resolution down to ~ 1 µm. Different scan methods, optimized for quality and speed are available and discussed. Examples of energy related materials from fuel cell and battery research are shown.
An optional end station allows refraction enhanced imaging (synchrotron X-Ray refraction radiography (SXRR) and tomography (SXRCT)). That includes an analyzer Si-crystal in Bragg alignment between sample and detector. This technique obtains sensitivity to smaller structures (cracks, pores) down to a few wavelengths, while obtaining field of view sizes in the range of several mm. Besides medicine (e.g., teeth explants), several applications are found in material science, like studies on diesel particulate filters, ceramics, additively manufactured (AM) alloys and metal matrix composites (MMC). The in-situ capabilities include mechanical load (tension and compression) and heating up to 1100°C. A case study, the microstructural evolution during heat treatment of an AM AlSi10Mg, will be shown.
Synchrotron X-Ray computed tomography at the BAMline is constantly evolving. During monochromatic tomographic scans a preview reconstruction is offered. Newly introduced scanning schemes suppress certain types of reconstruction artifacts. Additionally, the application of a pink beam enables for faster tomographic scans even within seconds.
In various kinds of radiography, deficient transmission imaging may occur due to backlighting inside the detector itself arising from light or radiation scattering. The related intensity mismatches barely disturb the high resolution contrast, but its long range nature results in reduced attenuation levels which are often disregarded. Based on X-ray observations and an empirical formalism, a procedure is developed for a first order correction of detector backlighting. A backlighting factor is modeled as a function of the relative detector coverage by the sample projection. Different cases of sample transmission are regarded at different backlight factors and detector coverage. The additional intensity of backlighting may strongly affect the values of materials’ attenuation up to a few 10%. The presented scenario provides a comfortable procedure for corrections of X-ray or neutron transmission imaging data.