Chemie und Prozesstechnik
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X-ray photoelectron spectroscopy (XPS) was performed on the meniscus of a droplet of ionic liquid 1-propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl) imide [PMIM]+[NTf2]− (Solarpur®) in ultrahigh vacuum. High-resolution spectra of F 1s, O 1s, N 1s, C 1s, and S 2p are presented along with a survey spectrum and the valence band structure. The spectra presented here were generated using monochromatic Al Kα radiation (1486.6 eV).
1-Propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl)imide (Solarpur®), an ionic liquid was purchased from Merck (formerly Sigma Aldrich), was analyzed using hard x-ray photoelectron spectroscopy (HAXPES). The liquid is UHV stable, vertically and laterally homogeneous, and is easy to clean; thus, it can be used as a reference material. The HAXPES spectra of Solarpur® obtained using monochromatic Cr Kα radiation at 5414.8 eV include a survey scan, high-resolution spectra of C 1s, O 1s, N 1s, S 2p, S 1s, S 2s, F 1s, and S KLL.
(1) First results show the suitability of IL as reference for quantification of XPS (at least for organic materials).
(2) Different quantification methods lead to similar results (with a slight advantage for “background method”).
(3)Promising reference material for a better understanding and traceable protocols for the quantification of organic materials with XPS.
The uncertainty of measurement in quantitative XPS analysis can be reduced by using a calibrated spectrometer transmission function T (E), which is usually determined by taking spectra from Au, Ag, Cu and Ge elemental reference materials. However, this approach is quite time-consuming due to required sample preparation steps like sputter cleaning etc., and the relatively big number of samples to be measured. This contribution proposes the use of the ionic liquids [C2C1im][NTf2] and [C3C1im][NTf2] as reference materials for a determination of T(E). These multi-elemental samples deliver five intensive photoemission peaks, F 1s, O 1s, N 1s, C 1s and S 2p, in an energy window from 160 eV to 700 eV which is of specific interest for applications of quantitative XPS for surface chemical analysis of soft matter, one of the major applications of XPS.