8.3 Thermografische Verfahren
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- Zeitschriftenartikel (4) (entfernen)
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- Thermography (4)
- Laser thermography (3)
- NDT (2)
- Thermal wave (2)
- VCSEL (2)
- Blind structured illumination (1)
- Heat diffusion (1)
- Laser (1)
- Lock-in (1)
- Lock-in thermography (1)
Organisationseinheit der BAM
Photothermal radiometry with an infrared camera allows the contactless temperature measurement of multiple surface pixels simultaneously. A short light pulse heats the sample. The heat propagates through the sample by diffusion and the corresponding temperature evolution is measured at the sample’s surface by an infrared camera. The main drawback in radiometric imaging is the loss of the spatial resolution with increasing depth due to heat diffusion, which results in blurred images for deeper lying structures. We circumvent this information loss due to the diffusion process by using blind structured illumination, combined with a non-linear joint sparsity reconstruction algorithm. The structured illumination is realized by parallel laser lines from a vertical-cavity surface-emitting laser (VCSEL) array controlled by a random binary pattern generator. By using 150 different patterns of structured illumination and our iterative joint sparsity algorithm, it was possible to resolve 1 mm thick lines at a distance down to 0.5 mm, which results in a resolution enhancement of approximately a factor of four compared to the resolution of 5.9 mm for homogenous illuminated thermographic reconstruction.
We report on photothermal detection of subsurface defects by coherent superposition of thermal wave fields. This is made possible by structured heating using high-power VCSEL laser arrays whose individual emitter groups can be arbitrarily controlled. In order to locate the defects, we have developed a scanning method based on the continuous wavelet transformation with complex Morlet wavelet using the destructive interference effect of thermal waves. This approach can also be used for thermally very fast and highly reflective materials such as uncoated aluminum. We show that subsurface defects at an aspect ratio of defect width to defect depth down to 1/3 are still detectable in this material.
Mit Laserlicht kann man eine Materialoberfläche berührungslos und schnell moduliert aufheizen. Dabei entsteht eine stark gedämpfte Wärmewelle, die tief ins Material eindringen kann. Erzeugt und überlagert man solche thermischen Wellen auf kohärente Weise, dann kann man damit versteckte Materialfehler zerstörungsfrei und sehr präzise aufspüren. Sogar eine bildgebende Tomografie ist denkbar.
In the field of optically excited thermography, flash lamps (impulse shaped planar heating) and halogen lamps (modulated planar heating) have become established for the specific regimes of impulse and lock-in thermography. Flying-spot laser thermography is implemented by means of a rasterized focused laser, e. g. for crack detection (continuous wave operation) and photothermal material characterization (high-frequency modulated). The availability of novel technologies, i. e. fast and high-resolution IR cameras, brilliant innovative light sources and high-performance data acquisition and processing technology will enable a paradigm shift from stand-alone photothermal and thermographic techniques to uniform quantitative measurement and testing technology that is faster and more precise. Similar to an LED array, but with irradiance two orders of magnitude higher, a new type of brilliant laser source, i. e. the VCSEL array (vertical-cavity surface-emitting laser), is now available. This novel optical energy source eliminates the strong limitation to the temporal dynamics of established light sources and at the same time is spectrally clearly separated from the detection wavelength. It combines the fast temporal behavior of a diode laser with the high optical irradiance and the wide illumination area of flash lamps. In addition, heating can also be carried out in a structured manner, because individual areas of the VCSEL array can be controlled independently of each other. This new degree of freedom enables the development of completely new thermographic NDT methods.