6 Materialchemie
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In contrast to the crisp, clear images you can get from electron microscopy, small-angle X-ray scattering (SAXS) patterns are rather featureless. These patterns, however, contain averaged structural information of all of the finest material structures that were illuminated by the X-ray beam. With careful and precise investigation, and supplementary information from complementary techniques, this bulk material structure can be quantified to reveal structural information spanning four or even five decades in size. Additionally, while the data correction and analysis is complex, sample preparation is very straightforward, also allowing for in-situ and operando measurements to be performed without breaking a sweat. In the right hands, then, this technique can be the most powerful tool in your analytical arsenal.
No matter whether you are doing X-ray diffraction or scattering, at wide or small angles, in a lab or at a synchrotron, you will need a bespoke sequence of up to twenty different corrections before it gets about right (at our latest count). Our library now does this automatically and reliably to get you the data you deserve – in absolute units and with uncertainty estimates – without the pain. This talk will highlight the development of the modular library, the sequence and its foundation, show its applicability to real-world datasets, and highlight a possible way forward
Everything SAXS
(2019)