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Cr3+-doped MgF2 systems are synthesised by a novel non-aqueous soft chemistry route using different Cr precursors and varying Cr loading. These systems have been characterized by X-ray powder diffraction (XRD), BET surface area, TPD of ammonia, FT-IR pyridine adsorption analysis and X-ray photoelectron spectroscopy, and tested for their catalytic activity in dismutation of CCl2F2 and CF3CHClF. Catalysts synthesised starting from CrO3 or (CH3CO2)7Cr3(OH)2 showed better catalytic activity than those prepared with CrCl3. FT-IR pyridine adsorption studies reveal that the catalytic activity is highly correlated with the Lewis acid strength. In TPD of NH3 catalysts prepared from CrO3 and (CH3CO2)7Cr3(OH)2, precursors showed a similar behaviour, different from that of catalysts prepared from CrCl3.
The dismutation of CCl2F2 was used to probe the effect of halogenation of chromia by Cl/F exchange reactions to find out the difference between the halogenated inactive and active catalysts. The heterogeneous reactions were performed in a continuous flow Ni reactor and also under simulated reaction conditions in a reactor where after the reaction X-ray photoelectron spectroscopy (XPS) and X-ray excited Auger electron spectroscopy (XAES) analyses are possible without air exposure of the catalyst, i.e., under so-called "in situ" conditions. The Cr(III) 2p XP spectra, which revealed multiplet splitting features and satellite emission, were used for chemical analysis by using a simple evaluation procedure which neglects this inherent complexity. Chemical analysis was also applied by using chemical state plots for Cr 3s in order to cross-check Cr 2p related results. Both ex and in situ XPS show that as soon as Cr2O3 is exposed to CCl2F2 at 390°C fluorination as well as chlorination takes place at the catalyst surface. When the XPS surface composition reaches approximately 4 at. % fluorination and 6 at. % chlorination, maximum catalytic activity was obtained. Application of longer reaction times did not change significantly the obtained surface composition of the activated chromia. The fluorination and chlorination of chromia was further investigated by various HF and HCl treatments. The activated chromia samples and the Cr2O3, Cr(OH)3, CrF2OH, CrF3·H2O, α-CrF3, β-CrF3, and CrCl3 reference samples with well-known chemical structures were also characterized by X-ray absorption near edge structure (XANES), time-of-flight secondary ion mass spectroscopy (TOF-SIMS), pyridine-FTIR, wet chemical (F and Cl) analysis, X-ray powder diffraction (XRD), and surface area (BET) analysis. The results suggest that the formation of chromium oxide chloride fluoride species, e.g., chromium oxide halides, at the surface is sufficient to provide catalytic activity. The presence of any CrF3 and/or CrCl3 phases on the activated chromia samples was not found.
Cr3+-doped MgF2 systems are synthesised by a novel non-aqueous soft chemistry route using different Cr precursors and varying Cr loading. These systems have been characterized by X-ray powder diffraction (XRD), BET surface area, TPD of ammonia, FT-IR pyridine adsorption analysis and X-ray photoelectron spectroscopy, and tested for their catalytic activity in dismutation of CCl2F2 and CF3CHClF. Catalysts synthesised starting from CrO3 or (CH3CO2)7Cr3(OH)2 showed better catalytic activity than those prepared with CrCl3. FT-IR pyridine adsorption studies reveal that the catalytic activity is highly correlated with the Lewis acid strength. In TPD of NH3 catalysts prepared from CrO3 and (CH3CO2)7Cr3(OH)2, precursors showed a similar behaviour, different from that of catalysts prepared from CrCl3.
Pure and PDMS contaminated PS oligomers films were investigated both by time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS).
The secondary ion spectra from the PDMS contaminated PS oligomers were almost completely related to PDMS. XPS revealed a PDMS contamination characterized by a silicon surface concentration of 6 at.%. Obviously siloxane contaminants existing on the surface of a silicon wafer may diffuse towards the PS oligomers outermost surface resulting in a rather high PDMS surface concentration of about 85%. Due to the known differences in the information depth and sensitivity of SSIMS and XPS very different detection limits are to be considered.
In elimination of siloxane contaminants by ultrasonication in hexane was found to be an effective way. Another common organic cleaning procedure, which is ultrasonication in trichloroethylene (TCE), subsequently in isopropanol and finally in acetone was found to be ineffective for cleaning of PDMS contaminated silicon wafers.
Static TOF-SIMS results strongly underpin earlier conclusions from ESCA, XANES, and tracer studies that the accumulation of fluorine and chlorine at the surface of chromia by a heterogeneous reaction with a chlorofluorocarbon compound results in the formation of mixed chromium oxide halide species and not in the nucleation of CrCl3 and/or CrF3 phases.