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Organisationseinheit der BAM
Investigation on Wall Thickness Ranges Using Digital Radiography for Tangential Projection Technique
(2018)
X-ray testing is based on the attenuation of X-rays when passing through matter. Image detectors acquire the X-ray information which is defined by the local penetrated wall thickness of the tested sample. By X-ray absorption in the detector and following read-out and digitization steps a digital image is generated. As detectors a radiographic film and film digitization, a storage phosphor imaging plate and a special Laser scanner (Computer Radiography - CR) or a digital detector array (DDA) can be used. The digital image in the computer can then be further analyzed using many types of image processing. In the presented work the automated evaluation of wall thickness profiles are investigated using a test steel pipe with 9 different wall thicknesses and various X-ray voltages and different filter materials at the tube port and intermediate between object and detector. In this way the influence of different radiation qualities on the accuracy of the automated wall thickness evaluation depending on the penetrated wall thickness of the steel pipe was investigated.
In this study, we systematically investigate the decay characteristics of upconversion luminescence (UCL) under anti-Stokes excitation through numerical simulations based on rate-equation models. We find that a UCL decay profile generally involves contributions from the sensitizer’s excited-state lifetime, energy transfer and cross-relaxation processes. It should thus be regarded as the overall temporal response of the whole upconversion system to the excitation function rather than the intrinsic lifetime of the luminescence emitting state. Only under certain conditions, such as when the effective lifetime of the sensitizer’s excited state is significantly shorter than that of the UCL emitting state and of the absence of cross-relaxation processes involving the emitting energy level, the UCL decay time approaches the intrinsic lifetime of the emitting state. Subsequently, Stokes excitation is generally preferred in order to accurately quantify the intrinsic lifetime of the emitting state. However, possible cross-relaxation between doped ions at high doping levels can complicate the decay characteristics of the luminescence and even make the Stokesexcitation approach fail. A strong cross-relaxation process can also account for the power dependence of the decay characteristics of UCL.