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Abstract. In power electronics, compound semiconductors with large bandgaps, like silicon carbide (SiC), are increasingly being used as material instead of silicon. They have a lot of advantages over silicon but are also intolerant of nanoscale material defects, so that a defect inspection with high accuracy is needed. The different defect types on SiC samples are measured with various measurement methods, including optical and tactile methods. The defect types investigated include carrots, particles, polytype inclusions and threading dislocations, and they are analysed with imaging ellipsometry, coherent Fourier scatterometry (CFS), white light interference microscopy (WLIM) and atomic force microscopy (AFM). These different measurement methods are used to investigate which method is most sensitive for which type of defect to be able to use the measurement methods more effectively. It is important to be able to identify the defects to classify them as critical or non-critical for the functionality of the end product. Once these investigations have been completed, the measurement systems can be optimally distributed to the relevant defects in further work to realize a hybrid analysis of the defects. In addition to the identification and classification of defects, such a future hybrid analysis could also include characterizations, e.g. further evaluation of ellipsometric data by using numerical simulations.
This report contains detailed information on the preparation of the reference material as well as on homogeneity and stability investigations of the property of interest, the equivalent particle diameter, and on the analytical methods to determine the additional properties. The values for particle size distribution are based on the results from laser diffraction measurements of 3 different devices with at least 3 replicate measurements of 4 randomly chosen units of the reference material P206.
This contributions shows the first results of the ongoing interlaboratory comparisons under VAMAS/TWA 34 Nanoparticle populations related on the determination of pasrticle size distribution and relative concentration of nanoparticles and an example of an ILC running under VAMAS/TWA 41 Graphene and Related 2D Materials on the determination of the lateral diemsnions of graphene oxide flakes by Scanning Electron Microscopy. The link to related standardisation projects at ISO/TC Nanotechnologies are explained.
Advanced materials, such as nanomaterials, 2D materials, or thin films, play a crucial role in driving economic development and addressing major challenges in the coming years. These challenges include mitigating the impact of climate change, advancing lightweight engineering, enhancing catalysis, and improving medical applications.
To comprehend the performance of these materials and ensure their acceptance across various sectors as safe and sustainable for both humans and the environment, the availability of reference procedures, materials, and data is essential. One versatile tool for establishing such references and evaluating the proficiency of individual laboratories and their competencies is through (international) interlaboratory comparisons (ILC). Notably, initiatives like the Versailles Project on Advanced Materials and Standards (VAMAS) provide a platform for conducting ILCs.
This webinar will showcase various examples of interlaboratory comparisons, illustrating their impact on the development of reference products.
The presentation includes aspects of material design and characterization with a focus on lignin. Examples are the structural elucidation of lignosulfonates by means of two-dimensional chromatography, the mechanochemical degradation and functionalization of Kraft-Lignin with accompanying analytics. Future projects involving the incorporation of lignin into polymers will be presented.
A thousand times thinner than a human hair, nanoparticles (NPs) are finding applications in a range of modern products. However, as some can affect human health or the environment, knowing the types present is essential. Electron microscopy is the ‘gold standard’ for NP analysis, allowing identification based on manual size analysis, but a new method was required to analyse these particles quickly, accurately and in a consistent way.
The talk summarizes challenges in microplastic analysis. It shows the preparation of microplastic reference materials as well as the testing on homogeneity and stability. The reference material is used in an international laboratory comparison to compare different detection methods used for microplastic analysis. The methods used were µ-IR (FTIR+LDIR) for number-based methods and TED-GC/MS and Py-GC/MS for mass-based methods. The ILC was done under the umbrella of VAMAS TWA 45. Results of the participants are presented.
Multiphoton lithography (MPL), an emerging microfabrication technique, shows great potential in a variety of applications ranging from tissue engineering to soft micro-robotics. Fabricated micro-objects often are expected to undergo shape morphing or bending. Furthermore, ensuring precise property tuning becomes detrimental for the functionality of MPL microstructures. Herein, we present novel MPL materials based on interpenetrating networks (IPNs), which effectively combine the advantages of acrylate and epoxy thermoset systems. A library of 3D MPL IPN microstructures with high 3D structural stability and tailored thermal and micromechanical properties is achieved. MPL laser velocity and fabrication power can be used to tune the morphology and therefore properties of IPN. New IPN microstructures with materials Young's moduli of 4 to 6 MPa demonstrate susceptibility to deformation with high to fully elastic response. Such soft elastic materials hold immense promise within morphable microsystems, soft micro-robotics and cell engineering applications.
Since microplastics (MPs) can be found everywhere and are becoming a problem of high concern, it is necessary to understand their physico-chemical properties. To obtain reliable analytical data a set of validated methods for sampling, sample preparation, detection, and data evaluation are needed.
To meet these needs an interlaboratory comparison (ILC) with 84 participants worldwide has been organized under the international pre-standardisation platform VAMAS (www.vamas.org/twa45/) as Project 2 “Development of standardized methodologies for characterisation of microplastics with microscopy and spectroscopy methods” within the Technical Working Area TWA 45 “Micro and Nano Plastics in the Environment”. In this ILC thermo-analytical methods (Py-GC/MS and TED-GC/MS) and vibrational methods (µ-Raman and µ-FTIR) have been tested and compared by providing a set of microplastic representative test materials and measurement protocols developed at BAM. The defined measurands were: particle number concentration, particle size distribution (PSD), and polymer identity and mass content. To increase the statistical quality, 6 samples were shipped together with blank samples. Hence, the ILC provides information on precision and accuracy of the results obtained with different methods as well as strengths and limitations of the proposed protocols.
Since microplastics (MPs) can be found everywhere and are becoming a problem of high concern, it is necessary to understand their occurrence and fate in the environment. However, to obtain data of high quality is very challenging, since measurement operating procedures differ from laboratory to laboratory. Currently, there are no standardized methods to analyze microplastics. One promissing possibility to adress standardization of the methodology and operating procedures are interlaboratory comparisons (ILCs). In this contribution we report the first results of an ILC on microplastic detection methods organized under the pre-stantdardisation plattform of VAMAS (www.vamas.org/twa45/) as Project 2 “Development of standardized methodologies for characterisation of microplastics with microscopy and spectroscopy methods”, within the Technical Working Area TWA 45 “Micro and Nano Plastics in the Environment”. The ILC has gathered 84 participants all over the world representing all continents. BAM, as the project leader, produced a set of reference microplastic materials, which have been distributed to all the participants together with the measurement protocols and reporting data templates.