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The present talk serves the routine characterization of the porous structure of unordered anatase NP-fillings by screen printing. Therefore the Focused Ion Beam technique was used to cut a defined volume of material slice per slice of the given material. From each slice electron micrographs are recorded. The won stack of images is than further processed using binarization and segmentation to reconstruct either the mesh of particles or pores. From the calibrated length-scales in the scanning electron microscope it is possible to determine the particular volumes for pore and material.
The realistic description of plastic deformation caused by dislocations demands the representative measurement of their features, e.g., Burgers vector, slip plane, line direction and density. In the case of bulk deformation of technical alloys, reliable data must be ensured for large regions. Nonetheless, the (thin) filiform nature of dislocations and also the heterogeneity in some microstructures additionally require flexible analysis techniques that resolve the details of their interactions. Strong and clear channeling contrasts, faint extinction contours and the absence of chromatic aberration make scanning transmission electron microscopy (STEM) an ideal imaging mode in wide and thick regions of TEM foils, as opposed to conventional (C)TEM. It is the purpose of this contribution to show how STEM can be applied for quantitative measurement of dislocation features. Furthermore, a new tool will be presented, which enables the three-dimensional (3D) reconstruction, visualization and quantification of dislocation densities and directions from stereo-pairs. The application of these techniques will be shown on a monocrystalline Ni-base superalloy, an important class of structural materials that has been implemented in the first row blades of gas turbines. The examples are extracted from specimens subjected to creep deformation at high temperature and low stress under various macroscopic deformation geometries. The spacial and angular accuracy are discussed as well as possible sources of error.