Principal component analysis (PCA)-assisted time-of-flight secondary-ion mass spectrometry (ToF-SIMS): a versatile method for the investigation of self-assembled monolayers and multilayers as precursors for the bottom-up approach of nanoscaled devices
- The production of high-quality self-assembled monolayers (SAMs) followed by layer-by-layer (LbL) self-assembly of macrocycles is essential for nanotechnology applications based on functional surface films. To help interpret the large amount of data generated by a standard ToF-SIMS measurement, principal component analysis (PCA) was used. For two examples, the advantages of a combination of ToF-SIMS and PCA for quality control and for the optimization of layer-by-layer self-assembly are shown. The first example investigates how different cleaning methods influence the quality of SAM template formation. The second example focuses on the LbL self-assembly of macrocycles and the corresponding stepwise surface modification.
Autor*innen: | Markus Holzweber, T. Heinrich, V. Kunz, S. Richter, C.H.-H. Traulsen, C.A. Schalley, Wolfgang UngerORCiD |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | Analytical chemistry |
Jahr der Erstveröffentlichung: | 2014 |
Verlag: | American Chemical Society |
Verlagsort: | Washington, DC |
Jahrgang/Band: | 86 |
Ausgabe/Heft: | 12 |
Erste Seite: | 5740 |
Letzte Seite: | 5748 |
Freie Schlagwörter: | Layer by layer; Principal component analysis; Self assembled monolayer; ToF-SIMS |
DOI: | 10.1021/ac500059a |
ISSN: | 0003-2700 |
ISSN: | 1520-6882 |
Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
Datum der Freischaltung: | 20.02.2016 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 03.07.2014 |