Straightforward correction of X-ray detector backlighting
- A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanismA novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed.…
Autor*innen: | Axel Lange, Andreas KupschORCiD, Manfred P. Hentschel, Bernd R. MüllerORCiD |
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Dokumenttyp: | Beitrag zu einem Tagungsband |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | 18th WCNDT - World conference on nondestructive testing (Proceedings) |
Jahr der Erstveröffentlichung: | 2012 |
Erste Seite: | 1 |
Letzte Seite: | 8(?) |
Freie Schlagwörter: | Computed tomography; Diffuse background; Fluorescent screen; Radiography; X-ray detector backlighting |
Veranstaltung: | 18th WCNDT - World conference on nondestructive testing |
Veranstaltungsort: | Durban, South Africa |
Beginndatum der Veranstaltung: | 2012-04-16 |
Enddatum der Veranstaltung: | 2012-04-20 |
URL: | http://www.ndt.net/article/wcndt2012/papers/205_wcndtfinal00205.pdf |
ISBN: | 978-0-620-52872-6 |
Verfügbarkeit des Dokuments: | Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access") |
Bibliotheksstandort: | Sonderstandort: Publica-Schrank |
Datum der Freischaltung: | 19.02.2016 |
Referierte Publikation: | Nein |