The role of helium implantation induced vacancy defect on hardening of tungsten
- Vacancy-type defects created by helium implantation in tungsten and their impact on the nano-hardness characteristics were investigated by correlating the results from the positron annihilation spectroscopy and the nano-indentation technique. Helium implantation was performed at room temperature (RT) and at an elevated temperate of 600 °C. Also, the effect of post-annealing of the RT implanted sample was studied. The S parameter characterizing the open volume in the material was found to increase after helium irradiation and is significantly enhanced for the samples thermally treated at 600 °C either by irradiation at high temperature or by post-annealing. Two types of helium-vacancy defects were detected after helium irradiation; small defects with high helium-to-vacancy ratio (low S parameter) for RT irradiation and large defects with low helium-to-vacancy ratio (high S parameter) for thermally treated tungsten. The hardness of the heat treated tungsten coincides with the S parameter, and hence is controlled by the large helium-vacancy defects. The hardness of tungsten irradiated at RT without thermal treatment is dominated by manufacturing related defects such as dislocation loops and impurity clusters and additionally by trapped He atoms from irradiation effects, which enhance hardness. He-stabilized dislocation loops mainly cause the very high hardness values in RT irradiated samples without post-annealing.
Author: | Xin Ou, Wolfgang Anwand, Reinhard Kögler, Hong-Bo Zhou, Asta Richter |
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URN: | urn:nbn:de:kobv:526-opus4-5623 |
DOI: | https://doi.org/10.1063/1.4870234 |
ISSN: | 1089-7550 |
Parent Title (English): | Journal of Applied Physics |
Document Type: | Article |
Language: | English |
Year of Publication: | 2014 |
Date of first Publication: | 2014/03/28 |
Publishing Institution: | Technische Hochschule Wildau |
Release Date: | 2017/06/06 |
Volume: | 115 |
Issue: | 12 |
Source: | The following article appeared in Ou et al., J. Appl. Phys. 115, 123521 (2014) and may be found at http://dx.doi.org/10.1063/1.4870234. |
Copyright: | This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. |
Faculties an central facilities: | Fachbereich Ingenieur- und Naturwissenschaften |
Dewey Decimal Classification: | 6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 621 Angewandte Physik |
Licence (German): | Das Dokument ist urheberrechtlich geschützt |