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Trace elements W and Hf have different influence on the microstructure and the mechanical properties when added to the Al10Co25Cr8Fe15Ni36Ti6 compositionally complex alloy. The addition of both can thus merge both element’s beneficial influences when combined with the appropriate heat treatment: Hf enhances the cubicity of the γ’ particles in the γ matrix while the W reduces the negative influence of the Heusler phase: this phase can be completely dissolved when W is present in the alloy.
For the precise determination of orientations in polycrystalline materials, electron backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in the scanning electron microscope (SEM). In the present paper, the variation of the projection center for the Kikuchi diffraction patterns which are measured by EBSD is calibrated using a projective transformation model for the SEM beam scan positions on the sample. Based on a full pattern matching approach between simulated and experimental Kikuchi patterns, individual projection center estimates are determined on a subgrid of the EBSD map, from which least-square fits to affine and projective transformations can be obtained. Reference measurements on single-crystalline silicon are used to quantify the orientation errors which result from different calibration models for the variation of the projection center.