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The phenomenon of expelling nanomaterial from microparticles of different materials, such as Au, WO3 or B2O3 under the influence of a convergent electron beam (CB) of a transmission electron microscope (TEM) was reviewed by Ignacio Gonzalez-Martinez [1]. Converging the e-beam in a TEM means that a high amount of energy enters the microparticle at a very local place and interact with the matter. Obviously, during the convergent beam protocol, no imaging with the electron beam is possible, but at the end, nanoparticles with different appearances lie down next to the microparticle while its size is reduced.
Hence, there is a blind spot in the observation, which we want to fill, as we want to help clarify the nature of the expelling phenomenon. One hypothesis that explains the phenomenon is the so-called damage (of the microparticle) induced by an electric field (DIEF). Within this theory, the material is ionized and expelled in form of ionic waves. Our aim is therefore to fabricate specimens with artificial microlandscapes, as schematically exemplified in figure 1a), using the focused ion beam (FIB) and micromanipulators, as experimental setups to follow the paths of the expelled material.
As a first step towards the fabrication of such specimen, we make experimental feasibility studies for each fabrication method, FIB structuring with Ga+ ion beam and micromanipulated microparticle deposition. Bridges (gray regions in Fig. 1) are created by milling a commercially available electron transparent membrane (silicon oxide or carbon) of a Cu-TEM grid. Platinum or carbon walls (blue features in Fig. 1) are built to stand on those bridges. Microparticles (yellow sphere in Fig. 1) of gold or other material are deposited in the center of the bridges.
Figure 2a) shows four square holes (black area) and between them the residual silicon oxide membrane bridges (dark grey). On top of the bridges, walls (light grey) are deposited. The width of the bridges is different, the walls overlap the holes as well as the distance between the walls is very small, so these and other parameters need to be optimized. Figure 2b) shows a square hole (black) with bridges (white) on the right side on top of a carbon membrane (grey). There are still some obstacles which needs to be eliminated. For instance, the deposition process of the walls is not reliable as visible at the wall on top where a hole arises instead of a wall.
These studies are still in progress and the results are further discussed in terms of the applicability for the DIEF experiment in the TEM.
Nowadays, in every terrestrial and aquatic ecosystem, even in the remotest areas, small residues of plastics, the so called microplastic (MP) can be found. MPs are particles with a size of 1-1000 µm (ISO/TR 21960:2020), mainly containing synthetic polymers like polyethylene (PE), polypropylene (PP), polystyrene (PS) or polyethylene terephthalate (PET). Even styrene-butadiene rubber (SBR) as an indication for tire wear is included due to similar particle formation. To understand the MPs consequences to the environment, it is of high priority to capture its extent of contamination. It is surprising that in the analysis of polymer masses in environmental samples, PE, PS and SBR are often detected, but only small amounts of PP, although this is the second most commonly produced standard plastic and many MP particles originate from carelessly disposed packaging materials.
This presentation provides hypotheses about the reasons of rare PP identification and mass quantification in environmental samples. Different investigations of pristine PP and representative environmental samples, including the pre-treatment by Accelerated Solvent Extraction (ASE) or with density separation followed by the thermal extraction / desorption gas chromatography-mass spectrometry (TED-GC/MS) are presented. The results are discussed according to the material properties and a possible degradation mechanism under different weathering conditions which indicate less stability under relevant storage conditions.
This poster presents the focused ion beam preparation methodologies developed within the framework of the EU funded EURAMET project ADVENT (Advanced Energy-Saving Technology).
It summarises the key breakthroughs achieved for various in situ investigation techniques, e.g. in situ experiments at the Synchrotron facility BESSY II (IR-SNOM and XRS), TEM and SMM instrumentation.
The created experimental devices from diverse thin-film semiconductor materials paved the way to dynamic structural studies bearing the potential to determine nanoscale correlations between strain and electric fields and, moreover, for the fundamental development of new in situ capabilities.