Ingenieurwissenschaften und zugeordnete Tätigkeiten
Filtern
Erscheinungsjahr
- 2022 (7) (entfernen)
Dokumenttyp
- Vortrag (7) (entfernen)
Sprache
- Englisch (7)
Referierte Publikation
- nein (7)
Schlagworte
- Graphene (2)
- Nanomaterials (2)
- XPS (2)
- Advanced Materials (1)
- Chemical composition (1)
- Graphene related materials (1)
- HAXPES (1)
- Hard X-ray photoelectron spectroscopy (1)
- Imaging (1)
- Interlaboratory Comparisons (1)
Organisationseinheit der BAM
- 6 Materialchemie (7) (entfernen)
Eingeladener Vortrag
- nein (7)
Nanoforms with at least one dimension below 100 nm have an important part to play in more and more areas of our daily life. Therefore, risk assessment of these materials is becoming increasingly important. In this context, the European Chemical Agency (ECHA) considered eleven physico-chemical properties as relevant, of which the following six are essential for the registration: chemical composition, crystallinity, particle size, particle shape, surface chemistry and specific surface area. Four of these priority properties can be obtained with electron microscopy and surface analytics like XPS and ToF-SIMS. The reliability of this data must be ensured, especially for their use for grouping and read across approaches. On the other hand, the “reproducibility” crisis has revealed major shortcomings in the reliability of published data.
In a case study, we show how the quality of the data can be ensured by using existing standards and protocols of each step in the workflow of sample characterization. As exemplary samples, two Al-coated TiO2 samples as nanopowders were selected from the JRC repository, capped either with a hydrophilic or a hydrophobic organic ultrathin shell. SEM results provided the size and shape of the nanoparticles, a first overview about the composition was obtained with EDS. XPS and ToF-SIMS supplied the surface chemistry, especially information about the shell and the coating of the particles. Standards and protocols of all steps of the analytical workflow including preparation and data reduction are discussed regarding reliable and reproducible data. Additionally, uncertainties for the different steps are specified.
Only such a detailed description of all these factors allows a comprehensive physico-chemical characterization of the nanoparticles with understanding of their potential risk assessment.
XPS of GR2M
(2022)
VAMAS-Enabling international standardisation for increasing the take up of Emerging Materials
(2022)
VAMAS (Versailles Project on Advanced Materials and Standards) supports world trade in products dependent on advanced materials technologies by providing technical basis for harmonized measurements, testing, specification, reference materials and standards. The major tools for fulfilling this task are interlaboratory comparisons (ILC). The organisation structure of VAMAS is presented. It is discussed, how a new technical activity can initiate.
The Competence Centre nano@BAM is presenting a new X-ray Photoelectron Spectrometer – the HAXPES (XPS at hard energy) – for researching advanced materials at the nanoscale. With HAXPES detailed chemical information can now be gained not only from the first outermost nanometres of the sample surface, but also from deeper regions.
Top international experts will share their knowledge and key findings on how to utilise HAXPES for exploring the surface of various advanced materials. Following the lectures, we will show you a short demo of the new instrument and answer your questions.