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Although there are many experimental techniques for measuring particle sizes and size distributions, electron microscopy (EM) is still considered as the gold standard in this field, especially when it comes to particle sizes in the nanorange (1 nm – 100 nm). Furthermore, high-resolution X-ray spectroscopy (EDS) can be applied to individual nanoparticles. To be able to extract accurate information from the EM micrographs and EDS elemental maps that are representative for the material under investigation, one needs to assure the representativity of the particles as sampled on the substrate and their homogeneous spatial distribution, to avoid operator bias when selecting the imaged area. Furthermore, agglomeration should be avoided as far as possible. Several sample preparation techniques exist since a long time, the most common way being suspending the particles in a liquid and depositing them on the grid. However, this procedure includes the drying of larger solvent amounts on the substrate itself, which can affect the spatial distribution of the deposited particles. One possibility to overcome this problem is the use of an electrospray system, where the suspension of particles is sprayed onto the substrate in charged droplets that are so small that they either dry off on the substrate immediately without affecting the position of particles, or even already during their flight time to the substrate. No dedicated commercial instruments are available for the preparation of TEM grids yet, only electrostatic deposition of aerosols on TEM grids has been reported so far. To test the prototype and assess its performance, several materials have been sprayed onto TEM grids and the resulting particle distributions were compared to more traditional sample preparation strategies like the “drop on grid” method. Operation parameters such as the sample flow-rate, capillary – substrate distance, electric field strength and sampling period length have been optimised. It was found that the particles deposited by electrospray generally show a much more homogeneous spatial distribution on the substrate and a substantial increase of the number of single particles, which are much better suited to an automatic image evaluation procedure than the agglomerated particles observed otherwise. The applicability of the technique to a broad range of materials is demonstrated by various examples, but also the influence of the substrate, the choice of the particular TEM grid, on the obtained spatial particle distribution is assessed.
The overall objective of project Improved traceability chain of nanoparticle size measurements is to improve the traceability chain for nanoparticle size measurements. The main impact will be achieved by manifold contributions to standard documents for CEN/TC 352 “Nanotechnologies”, which directly addresses the research needs of CEN, CENELEC and ETSI mandated by EC to develop standards for methods and reference materials to accurately measure the size and size distribution of nanoparticles. This will take place in collaboration with ISO/TC229 ‘Nanotechnologies’, ISO/TC24/SC4 ‘Particle characterization’ and ISO/TC201 ‘Surface analysis’/ SC9 ‘Scanning probe microscopy’.
The presentation goes into the characterization of TiO2 engineered nanoparticles within EU/FP7 SETNanoMetro Project and the nanomaterial classification according to the EC definition tested within EU/FP7 NanoDefine Project. Further, ISO/TC 229/JWG 2 activities related on ISO standards in development and inter-laboratory comparisons on measurement of nanoparticle size and shape distribution by SEM and TEM are discussed.
The capability of currently available particle sizing techniques for reliable classification of materials that potentially fall under the EU Definition of a nanomaterial is discussed. A systematic quantitative evaluation of the sizing techniques is presented together with representative case studies of analysis of industrially relevant materials.
Recommendations on the most appropriate and efficient use of techniques for different types of material are given.
The large European nanometrology Project NanoDefine is presented briefly with respect to the challenges of measurement of particle size distribution for complex nanoparticulate materials.
The methods chosen for a tiered approach for the classification of a nanomaterial are discussed with regard to their peformance. Representative resuls on real life, complex shaped nanoparticulate materials are shown.
The recently initiated VAMAS inter-laboratory comparisons to determine the reproducibility necessary for international standardisation have been also presented.
The press conference on the results of the European Project FP7 constitutes a dissemination event dedicated to the production and characterization of "Shape-engineered TiO2 nanoparticles for metrology of functional properties: setting design rules from material synthesis to nanostructured devices" with the main large-scale applications in the three reference sectors: energy, health and environment.
At the Final Outreach Event of the European FP7 NanoDefine project the results achieved during 4 years of intensive research and development work (2013-2017) with relevant stakeholders and wider community, and their practical implications and impact are presented and discussed. The newly developed particle-size related measurement tools and their practical suitability and applicability to classify materials, formulations and products according to the EC recommendation on the definition of a nanomaterial (2011/696/EU) are demonstrated.
Of many experimental techniques for measuring particle sizes and size distributions, electron microscopy (EM) is still considered as the gold standard, especially in the nano range (1–100 nm). Furthermore, high-resolution X-ray spectroscopy (EDX) in conjunction with EM can be applied to individul NPs.
Preparation of an EM sample for generic particulate materials is a difficult task. Usually, the particles in a suspension are deposited on a support. However, this procedure includes the drying of larger solvent amounts on the substrate itself, and this can affect the spatial distribution of the deposited particles. One possibility to overcome this is the use of an electrospray system, where the suspension of particles is sprayed onto the substrate in charged droplets that are so small that they either dry off on the substrate immediately without affecting the position of particles, or even already during their flight time to the substrate. Additionally, the charging of particles minimizes agglomeration and aggregation, maximizing the collection of the EM grids.
The prototype of an electrospray deposition System was tested. Electrospray is theoretically described since a long time, but no dedicated commercial instruments are available for the preparation of TEM grids yet, apart from electrostatic deposition of aerosols.
Several materials have been sprayed onto TEM grids and the resulting particle distributions were evaluated. Operation parameters such as the sample flow-rate, capillary – substrate distance, electric field strength and sampling period length have been optimized. It was found that the particles deposited by electrospray generally show a much more homogeneous spatial distribution on the substrate and a substantial increase of the number of single particles (suited to automatic analysis).
The synthesis of TiO2 nanoplatelets with fluorine-containing reactants is carried out using Ti (IV) butoxide as precursor and concentrated HF as shape controller, the final product requires a working up in order to eliminate or at least to reduce the amount of residual fluorides, which is realized here by well-defined thermal treatment.
Qualitative investigation of the bulk elemental composition by means of EDX of TiO2 nanoparticles (NPs) has identified fluorine in case of the as-synthesized samples. EDX spectra of thermally treated products exhibit either a fluorine content close to the limit of detection. The latter holds also true for the reference sample, TiO2 NPs of bipyramidal shape and prepared by a different synthesis route. For differentiation whether fluorine is present in the bulk or at the surface of the TiO2 nanoplatelets, top-surface sensitive AES and ToF-SIMS has been applied. Secondary ions of fluorine are detected in ToF-SIMS spectra of all samples, but could be roughly quantified by measurement of same reference sample as for EDX, namely TiO2 nano-bipyramids. This revealed that the amount of fluorine within1 nm depth beneath the surface is reduced in the thermally treated specimen compared to the raw product down to a content about as low as in the reference sample. AES allows analyzing analysis of the first few nanometers from the top-surface of individual NPs by point analysis. An F KLL peak has been detected at the surface of samples of as-prepared TiO2 nanoplatelets under optimized measurement conditions, but was not detectable after their calcination, which is in agreement with ToF-SIMS results. Moreover, high resolution AES on single TiO2 nanoplatelets elucidated that the surface atomic layers surrounding the TiO2 nanopaltelet contain fluorides before thermal treatment of the NPs.
Self-assembly of TiO2 nanoparticles in multiple layers by layer-by-layer deposition has been selected of different deposition procedures usually applied for fabrication of TiO2 thin films with defined and homogeneous thickness on supports of interest for the large-scale applications. The substrates tested were: conductive (FTO) glass, silica glass and titanium alloy. The selected film fabrication technique consists of the deposition of alternating layers of oppositely charged, i.e. functionalized, TiO2 nanoparticle layers with wash steps in between. The controlled assembly of TiO2 nanoparticles on the supports surface requires both a proper functionalization of the supports to promote the adhesion of the TiO2 film to the substrates and proper functionalization of TiO2 nanoparticles to allow attachment to substrate and subsequent reaction between different NP layers. The current study focusses on the analytical control of the functionalization of the substrates with 3-Aminopropyltriethoxysilane (APTS) and glutaraldehyde (GA) by means of surface sensitive methods, XPS, Auger Electron Spectroscopy (AES) and ToF-SIMS. Chemical composition of surface of functionalized substrates shows differences in the degree and type of modification in dependence on substrate.