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AbstractIn this study, we compare the residual stress state in a laser powder bed fusion (PBF‐LB/M) AlSi10Mg alloy in the as‐built (AB) condition with that after two different heat treatments (265 °C for 1 h, HT1; and 300 °C for 2 h, HT2). The bulk residual stress (RS) is determined using synchrotron X‐ray diffraction (SXRD), and near‐surface profiles are determined using laboratory energy‐dispersive X‐ray diffraction (EDXRD). The EDXRD results do not reveal any notable difference between the conditions at a depth of 350 μm, suggesting that the machining process yields a comparable residual stress state in the near‐surface regions. On the other hand, the SXRD results show that HT1 is more effective in relieving the bulk RS. It is observed that HT1 reduces the RS state in both the aluminium matrix and the silicon network. In addtion, HT2 does not have a significant impact on relaxing the RS as‐built state of the matrix, although it does induce a reduction in the RS magnitudes of the Si phase. It is concluded that the heat treatment stress relieving is effective as long as the Si‐network is not disaggregated.
Influence of a 265 °C heat treatment on the residual stress state of a PBF-LB/M AlSi10Mg alloy
(2022)
Laser Powder Bed Fusion (PBF-LB/M) additive manufacturing (AM) induces
high magnitude residual stress (RS) in structures due to the extremely heterogeneous cooling and heating rates. As the RS can be deleterious to the fatigue resistance of engineering components, great efforts are focused on understanding their generation and evolution after post-process heat treatments. In this study, one of the few of its kind, the RS relaxation induced in an as-built PBF-LB/M AlSi10Mg material by a low-temperature heat treatment (265 °C for 1 h) is studied by means of X-ray and neutron diffraction. Since the specimens are manufactured using a baseplate heated up to 200 °C, low RS are found in the as-built condition. After heat treatment a redistribution of the RS is observed, while their magnitude remains constant. It is proposed that the redistribution is induced by a repartition of stresses between the a-aluminium matrix and the silicon phase, as the morphology of the silicon phase is affected by the heat treatment. A considerable scatter is observed in the neutron diffraction RS profiles, which is principally correlated to the presence (or absence) of pockets of porosity developed at the borders of the chessboard pattern.
Al-Si alloys produced by Laser Powder Bed Fusion (L-PBF) techniques allow the fabrication of lightweight free-shape components that find space in aerospace, automotive, biomedical and military applications. Due to the high cooling rates occurring during the building process, L-PBF AlSi10Mg alloys exhibit an ultra-fine microstructure that leads to superior mechanical properties in the as-built condition compared to conventional cast Al-Si materials. Nevertheless, L-PBF processing induces high thermal gradients, leading to deleterious residual stress levels that must be considered to avoid part distortion and unpredicted failures. In order to relax detrimental residual stress and to increase the ductility, post-processing stress relief treatments are generally performed. In as-built condition the hypoeutectic AlSi10Mg microstructure consist of fine α-Al cells containing uniformly dispersed silicon nanoparticles, which are, in addition, surrounded by a eutectic Si network. Above 260°C the silicon interconnectivity starts to breakdown into spheroidized particles and to coarsen. At the same time, the heating residual stresses are relieved.
The objective of the contribution is to investigate, under different heat treatment conditions, the evolution of microstructure and residual stresses in view of optimizing the fatigue performance of the alloy. To this purpose various heat treatments in a range of temperatures between 265°C and 300°C for a duration between 15 minutes and 2 hours are performed. The microstructure modifications are analysed using a scanning electron microscope and the residual stress state is measured by laboratory X-ray diffraction.