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Materials and chemical producers require detailed knowledge of surface chemistry for research into new products. One way to understand a surface without damaging it is to bombard it with an electron beam, causing its atoms to emit characteristic X-rays enabling identification. The measurement of these must be precise as many elements emissions are close in energy – traceable reference materials will ensure instruments using this technique are stable and accurate.
IND15 JRP SurfChem: Traceable quantitative surface chemical analysis for industrial applications
(2016)
The SurfChem project has made a significant contribution to traceable quantitative surface chemical analysis for industrial applications by delivering new certified reference materials and test samples for specific technical applications. Regular performance tests of instruments, metrological methodology for the detection of (bio)organic surface species, ambient and non-destructive surface chemical analysis for in-line process control and new in situ characterisation techniques of catalytically active surfaces have been achieved.
CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. The Surface Analysis Working Group (SAWG) has been formally founded in 2003. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference:
- to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis;
- to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis;
- to establish and update a work plan to be adopted by CCQM;
- to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology.
Following the 2015 meeting of the CCQM, the pilot study CCQM-P130 “WD and ED Electron Probe Micro Analysis on Au-Cu alloys” lead by BAM&NIST has been finalized. The Key Comparison K-129 “Measurement of atomic fractions in Cu(In,Ga)Se2 Films” lead by KRISS has made substantial progress and is about to be finalized. The new Key Comparison K-136 on “BET specific surface of ” lead by UNIIM&BAM has made strong progress in 2015 and will be finished in 2016.