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The content of chromium in different oxidation states in chromium-treated wood was studied with XANES (X-ray absorption near-edge structure) measurements at the Cr K absorption edge. It could be shown that wood samples treated with Cr(VI) (pine and beech) did still contain a measurable content of Cr(VI) after four weeks conditioning. If such wood samples were heat exposed for 2 h with 135 °C prior conditioning, Cr(VI) was no longer detected by XANES, indicating a complete reduction to chromium (III).
A set of compound refractive lenses (CRLs), mounted on a silicon wafer, was obtained from the Institut für Mikrostrukturtechnik Karlsruhe. The CRLs were characterized at the BAMline at the synchrotron BESSYII in Berlin. It could be demonstrated that beam diameters below 1 µm can be obtained. The beam size accepted by the lenses is (140 × 140) µm2, thus the intensity gain in the micrometer spot, including absorption, is about 15,000. It is possible to switch between different beam energies within a few minutes. First results of scans and the application of the lenses for MicroXANES (X-ray absorption near-edge structure) measurements are presented in this paper. Also, the possibility of MicroEXAFS (extended X-ray absorption fine structure) measurements is discussed.