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Catastrophic optical damage (COD) is analyzed during single current pulse excitation of 975 nm emitting diode lasers. Power transients and thermal images are monitored during each pulse. The COD process is unambiguously related to the occurrence of a thermal flash of Plancks radiation. We observe COD to ignite multiple times in subsequent pulses. Thermography allows for tracing a spatial motion of the COD site on the front facet of the devices. The time constant of power decay after the onset of COD has values from 400 to 2000 ns, i.e., an order of magnitude longer than observed for shorter-wavelength devices.
Single-pulse tests of the catastrophic optical damage (COD) are performed for three batches of diode lasers with different gain-regions. The tests involve in situ inspection of front, rear, and side of the devices by a thermocamera. Devices with an Al-containing gain-region show COD at the front facet, as expected for strong facet heating via surface recombination and reabsorption of laser light. In contrast, Al-free devices with low surface recombination rates tend to fail at the rear facet, pointing to a different heating scenario. The high carrier density at the rear facet favors heating and COD via Auger recombination processes.
Double-side cooled high-power diode laser bars packaged by different techniques on different types of passive heat sinks are analyzed in terms of packaging-induced strain. Reference data from standard devices being single-side cooled only and packaged by conventional soft and hard soldering are also presented. Thermal profiling across the devices complements the results. The most suitable packaging architecture and technique for double-side cooled bars is identified. Measurements of the laser emission near field and electroluminescence pattern provide direct reference to the functionality of the devices. Furthermore, a type of cross calibration of the methods used for strain analysis is made, since all techniques are applied to the same set of bars. This involves micro photoluminescence, micro Raman, and degree-of-polarization electroluminescence spectroscopy.
This article presents deep unfolding neural networks to handle inverse problems in photothermal radiometry enabling super-resolution (SR) imaging. The photothermal SR approach is a well-known technique to overcome the spatial resolution limitation in photothermal imaging by extracting high-frequency spatial components based on the deconvolution with the thermal point spread function (PSF). However, stable deconvolution can only be achieved by using the sparse structure of defect patterns, which often requires tedious, handcrafted tuning of hyperparameters and results in computationally intensive algorithms. On this account, this article proposes Photothermal-SR-Net, which performs deconvolution by deep unfolding considering the underlying physics. Since defects appear sparsely in materials, our approach includes trained block-sparsity thresholding in each convolutional layer. This enables to super-resolve 2-D thermal images for nondestructive testing (NDT) with a substantially improved convergence rate compared to classic approaches. The performance of the proposed approach is evaluated on various deep unfolding and thresholding approaches. Furthermore, we explored how to increase the reconstruction quality and the computational performance. Thereby, it was found that the computing time for creating high-resolution images could be significantly reduced without decreasing the reconstruction quality by using pixel binning as a preprocessing step.
Learned block iterative shrinkage thresholding algorithm for photothermal super resolution imaging
(2022)
Block-sparse regularization is already well known in active thermal imaging and is used for multiple-measurement-based inverse problems. The main bottleneck of this method is the choice of regularization parameters which differs for each experiment. We show the benefits of using a learned block iterative shrinkage thresholding algorithm (LBISTA) that is able to learn the choice of regularization parameters, without the need to manually select them. In addition, LBISTA enables the determination of a suitable weight matrix to solve the underlying inverse problem. Therefore, in this paper we present LBISTA and compare it with state-of-the-art block iterative shrinkage thresholding using synthetically generated and experimental test data from active thermography for defect reconstruction. Our results show that the use of the learned block-sparse optimization approach provides smaller normalized mean square errors for a small fixed number of iterations. Thus, this allows us to improve the convergence speed and only needs a few iterations to generate accurate defect reconstruction in photothermal super-resolution imaging.
Mechanisms and fast kinetics of the catastrophic optical damage (COD) in GaAs-based diode lasers
(2011)
COD diagram determined for a batch of broad-area AlGaAs diode lasers. The time to COD within a single current pulse is plotted versus the actual average optical power in the moment when the COD takes place. Full circles stand for clearly identified COD events (right ordinate), whereas open circles (left ordinate) represent the pulse duration in experiments, where no COD has been detected. A borderline (gray) exists between two regions, i. e., parameter sets, of presence (orange) and absence of COD (blue). This borderline is somewhat blurred because of the randomness in filamentation of the laser nearfield and scatter in properties of the involved individual devices.
The early stages of catastrophic optical damage (COD) in 808 nm emitting diode lasers are mapped by simultaneously monitoring the optical emission with a 1 ns time resolution and deriving the device temperature from thermal images. COD occurs in highly localized damage regions on a 30 to 400 ns time scale which is determined by the accumulation of excess energy absorbed from the optical output. We identify regimes in which COD is avoided by the proper choice of operation parameters.
Wärmebehandlung und zerstörungsfreie Prüfung: Oberflächenrisse mit der Laser-Thermografie finden
(2015)
Die Thermografie als zerstörungsfreies Prüfverfahren erlaubt das Erkennen einer Vielzahl von Defekten in unterschiedlichsten Werkstoffen. Hierzu ist zum einen eine Energiequelle erforderlich, welche einen Wärmestrom im Werkstück erzeugt, und zum anderen eine Infrarot-Kamera, welche den orts- und zeitabhängigen Temperaturverlauf der Werkstückoberfläche analysiert. Neue Ansätze unter Verwendung von Lasern ermöglichen nun auch die Prüfung auf winzige Oberflächenrisse. Die aktuelle Grenze der Nachweisempfindlichkeit für mittels klassischer Thermografie nur schwer prüfbare hochreflektierende Metalloberflächen liegt mit Rissbreiten und -tiefen bis hinunter in den Sub-Mikrometerbereich und damit im Bereich der fluoreszierenden Magnetpulver- und Eindringprüfung. Dabei sind jedoch weder Verbrauchsmittel, noch eine Oberflächenpräparation notwendig und eine Prüfung kann berührungslos und automatisiert über Entfernungen bis in den Meter-Bereich erfolgen. Bei der Wärmebehandlung und insbesondere beim Randschichthärten mittels Laserstrahlung stehen ebenfalls hochleistungsfähige Energiequellen zur Erzeugung intensiver dynamischer Temperaturgradienten zur Verfügung. Damit eröffnet sich unmittelbar die Möglichkeit der Integration der thermografischen Prüfung in die Fertigung. Der Beitrag stellt die neuesten Entwicklungen der vielversprechenden Laser-Thermografie-Technik vor und zeigt, warum deren Einsatz potentiell die Standardprüfverfahren Magnetpulver- bzw. Eindringprüfung für eine Reihe von Prüfproblemen beerben könnte.
In the field of optically excited thermography, flash lamps (impulse shaped planar heating) and halogen lamps (modulated planar heating) have become established for the specific regimes of impulse and lock-in thermography. Flying-spot laser thermography is implemented by means of a rasterized focused laser, e. g. for crack detection (continuous wave operation) and photothermal material characterization (high-frequency modulated). The availability of novel technologies, i. e. fast and high-resolution IR cameras, brilliant innovative light sources and high-performance data acquisition and processing technology will enable a paradigm shift from stand-alone photothermal and thermographic techniques to uniform quantitative measurement and testing technology that is faster and more precise. Similar to an LED array, but with irradiance two orders of magnitude higher, a new type of brilliant laser source, i. e. the VCSEL array (vertical-cavity surface-emitting laser), is now available. This novel optical energy source eliminates the strong limitation to the temporal dynamics of established light sources and at the same time is spectrally clearly separated from the detection wavelength. It combines the fast temporal behavior of a diode laser with the high optical irradiance and the wide illumination area of flash lamps. In addition, heating can also be carried out in a structured manner, because individual areas of the VCSEL array can be controlled independently of each other. This new degree of freedom enables the development of completely new thermographic NDT methods.
Photothermal radiometry with an infrared camera allows the contactless temperature measurement of multiple surface pixels simultaneously. A short light pulse heats the sample. The heat propagates through the sample by diffusion and the corresponding temperature evolution is measured at the sample’s surface by an infrared camera. The main drawback in radiometric imaging is the loss of the spatial resolution with increasing depth due to heat diffusion, which results in blurred images for deeper lying structures. We circumvent this information loss due to the diffusion process by using blind structured illumination, combined with a non-linear joint sparsity reconstruction algorithm. The structured illumination is realized by parallel laser lines from a vertical-cavity surface-emitting laser (VCSEL) array controlled by a random binary pattern generator. By using 150 different patterns of structured illumination and our iterative joint sparsity algorithm, it was possible to resolve 1 mm thick lines at a distance down to 0.5 mm, which results in a resolution enhancement of approximately a factor of four compared to the resolution of 5.9 mm for homogenous illuminated thermographic reconstruction.