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The unique optical properties, such as size-tunable absorption and emission, caused semiconductor nanocrystals to attract a great deal of interest for recent technological developments. For the evaluation of semiconductor nanocrystals as new materials for various applications like optoelectronic devices, knowledge of the structure–property relationships is indispensable, but still presents a challenge. Here, we address these challenges for thioglycolic acid-capped CdTe nanocrystals with a focus on the quantification of thiol ligands, identification of the ligand shell structure and their influence on the optical properties of these nanocrystals. We present the use of a simple analytical technique, the Ellman's test, and ICP-OES analysis for the study of the surface chemistry of these nanomaterials. Together with theoretical calculations, the results of these studies show the strong influence of the amount of Cd–thiolates present in the ligand shell on the concentration-dependent emission properties, thereby providing the basis for a better understanding of the chemical nature of the NC–ligand interface. In this context, the present work contributes to the establishment of a clearer picture and better control of the surface chemistry, which will provide the basis for the design of highly emitting nanocrystals and the prediction of their applicability.
The CCQM-K88 key comparison was organized by the Inorganic Analysis Working Group of CCQM to test the abilities of the national metrology institutes to measure the mass fraction of lead in lead-free solder containing silver and copper. National Metrology Institute of Japan (NMIJ), National Institute of Metrology of China (NIM) and Korea Research Institute of Standards and Science (KRISS) acted as the coordinating laboratories. The participants used different measurement methods, though most of them used inductively coupled plasma optical emission spectrometry (ICP-OES) or isotope-dilution inductively coupled plasma mass spectrometry (ID-ICP-MS). Accounting for relative expanded uncertainty, comparability of measurement results was successfully demonstrated by the participating NMIs for the measurement of the mass fraction of lead in lead-free solder at the level of 200 mg/kg.
It is expected that metals at mass fractions greater than approximately 100 mg/kg in lead-free solder containing silver and copper can be determined by each participant using the same technique(s) employed for this key comparison to achieve similar uncertainties mentioned in the present report.
A 9Be-solution has been chemically prepared from phenakite (Be2SiO4) mineral grains as commercial 9Be-solutions are too high in long-lived 10Be. The solution is intended to be used as a carrier for radiochemical separation of 10Be to be measured by accelerator mass spectrometry (AMS). Thus, accurate data of the 9Be-concentration of this solution is essential to guarantee for high-accuracy 10Be data in the future. After devastating preliminary results (~8 % standard deviation), eight laboratories finally produced twelve individual results by four different analytical methods. A certain lab and method bias might be identified by sophisticated statistical evaluation. Some laboratories also (grossly) underestimate their uncertainties. Thus, the simple weighted mean of this round-robin exercise needed to be corrected by introducing additional allowances (Paule-Mandel-approach). The final result has been calculated to (2,246 ± 11) µg 9Be/(g solution) with a reasonably low weighted standard deviation of 0.49 %. The maximum deviation of a single lab value from the weighted mean is 2.4 % when removing one Grubbs outlier (11 % off from the mean) from the data set. As 10Be-data, which is usually calculated from measured 10Be/9Be by AMS and stable 9Be, cannot be more accurate than the determined 9Be-concentration, it seems highly advisable to establish or improve quality assurance by having self-made carrier-solutions analysed at more than a single lab and regularly taking part in round-robin exercises.