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- 2015 (18) (entfernen)
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- Vortrag (8)
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- EBSD (6)
- Electron backscatter diffraction (5)
- Simulation (5)
- Orientation mapping (3)
- Kikuchi patterns (2)
- Precipitation (2)
- X-ray diffraction (2)
- Band detection (1)
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Eingeladener Vortrag
- nein (8)
We demonstrate polarity-sensitive orientation mapping of non-centrosymmetric phases by Electron Backscatter Diffraction (EBSD). The method overcomes the restrictions of kinematic orientation determination by EBSD, which is limited to the centro-symmetric Laue-groups according to Friedel's rule. Using polycrystalline GaP as an example, we apply a quantitative pattern matching approach based on simulations using the dynamical theory of electron diffraction. This procedure results in a distinct assignment of the local orientation according to the non-centrosymmetric point group of the crystal structure under investigation.
Oxidation of a Fe –13Cr alloy under water vapor at 600°C produced a zone of nano-sized precipitation underneath the outside scale formed by iron oxides and Fe–Cr spinel. The majority of the spinel layer shows a fixed orientation relationship to the ferritic matrix: {1 0 0}α || {1 0 0}sp & <0 1 1>α || <0 0 1>sp . However, also the discovered precipitated particles are characterized by the same crystallographic orientation relationship to the respective ferritic parent grain. The habit of the precipitates is best described by a lath morphology with their main axis parallel to <1 0 0> of ferrite. Energy dispersive X-ray spectroscopy (EDX) and electron backscatter diffraction (EBSD) in scanning electron microscope (SEM) have been applied to characterize the oxide layer in micrometer scale. The clearly smaller precipitates were subsequently investigated by transmission electron microscopy (TEM). Specimens have been prepared by focused ion-beam (FIB) milling at an area previously characterized by EBSD. They cover the ferritic base material, but mainly the precipitation zone and the Fe–Cr spinel layer. Energy filtered selected area diffraction (SAD) in the conventional (C)TEM and high-angle annular dark field (HAADF) imaging in the scanning (S)TEM mode were employed in the characterization of the specimens.
Different models of Kikuchi pattern formation are compared with respect to their applicability to noncentrosymmetric crystals, and the breakdown of Friedel's rule in experimental electron backscatter diffraction (EBSD) patterns is discussed. Different AIIIBV semiconductor materials are used to evaluate the resulting asymmetry of Kikuchi band profiles for polar lattice planes. By comparison with the characteristic etch pit morphology on a single-crystal surface, the polar character of the measured lattice planes can be assigned absolutely. The presented approach enables point-group-resolved orientation mapping, which goes beyond the commonly applied Laue group analysis in EBSD.
Introduction to PowderCell
(2015)