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Erscheinungsjahr
- 2010 (21) (entfernen)
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- Vortrag (8)
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Schlagworte
- Femtosecond laser ablation (6)
- Dielectrics (2)
- Semiconductor (2)
- Silicon (2)
- Coherent scattering (1)
- Damage threshold (1)
- Drude model (1)
- Elemental semiconductors (1)
- Fourier transforms (1)
- Free electron lasers (1)
Eingeladener Vortrag
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This contribution investigates laser-induced damage of thin film and bulk polymer
samples, with the focus on physical processes occurring close to the damage threshold. In-situ
real-time reflectivity (RTR) measurements with picosecond (ps) and nanosecond (ns) temporal
resolution were performed on thin polymer films on a timescale up to a few microseconds (µs).
A model for polymer thin film damage is presented, indicating that irreversible chemical
modification processes take place already below the fluence threshold for macroscopic damage.
On dye-doped bulk polymer filters (as used for laser goggles), transmission studies using fs-and
ps-laser pulses reveal the optical saturation behavior of the material and its relation to the
threshold of permanent damage. Implications of the sub-threshold processes for laser safety
applications will be discussed for thin film and bulk polymer damage.