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- CdSe Films (1)
- Ellipsometry (1)
CdSe films grown on Ti-coated polished steel by constant-current deposition from an aqueous solution containing selenosulfite and cadmium nitrilotriacetate have been studied by spectroscopic ellipsometry under in-situ conditions. Ellipsometric parameters, tan? and cos?, were measured both as a function of deposition time at ? = 825 nm and of wavelength (? = 500-900 nm) for constant film thickness from 0.02 µm to 2.3 µm. The model used for data analysis, Ti-substrate | TiO2 | CdSe-film | solution, with optically homogenous phases was valid for film thickness larger than 0.3 µm. Refractive indices and extinction coefficients of the 2.3-µm film were derived for ? = 500900 nm. A direct band-gap of 1.72 eV was determined. The faradaic efficiency of electrodeposition was 0.93 for a current density of 50 µA cm-2.