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Many of the most successful and precise additive manufacturing (AM) technologies are based on the deposition layer-by-layer of a flowable powder. Since the first pioneering work at the end of the 1980th many developments have been introduced, greatly extending the use of different materials, improving the physical properties of the components built and enhancing the accuracy of the process. Still very important issues remain nowadays, hampering a completely autonomous production of parts and even restricting the freedom of design by means of these technologies. One of the major issues is the low density and stability of the parts during the building process, which implies the need of support structures: The powder bed surrounding the part has an essential role, since it should support the structure during building, until it’s ready for removal. Moreover, the microstructure of the powder bed is a template for the microstructure of the part produced. In this context, the use of submicron ceramic powders is still a challenge. Three approaches for the stabilization and densification of powder beds will be presented: The Layerwise Slurry Deposition process LSD, the gas flow assisted powder deposition and the Laser Induced Slipcasting (LIS) of ceramic powder compacts.
Dielectric breakdown of ceramics is widely believed to originate from microstructural defects. Still, there is no commonly accepted model for the origin and process of dielectric failure that covers all observed phenomena and dependencies. In analogy to mechanical strength, the Weibull distribution is commonly used to evaluate dielectric strength data. This works well for a given group of specimens with constant geometry. But unlike mechanical strength, dielectric strength scales with the inverse square root of sample thickness. This cannot be explained by the classic Weibull concept. The Griffith type energy release rate model of dielectric breakdown proposed by Schneider is based on space charge injection and conducting filaments from the sample surface. This model incorporates the distinct thickness dependence and the pronounced influence of surface defects. Based on this model and the classic Weibull probability of failure, Schneider’s group theoretically derived a probability of breakdown that predicts an increase of failure probability with increasing electrode area. In our study we tested this model with dielectric strength data measured on dense alumina samples using different electrode areas. Weibull modulus and characteristic dielectric strength (scale parameter) were determined for a set of measurements using small electrodes. These values were used to calculate the failure probability under large electrodes according to the model. The calculated data excellently fits the measured values. Thus, our experiments substantiate the assumptions made in the breakdown model and the significance of surface defects for dielectric failure.