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In this contribution, we discuss the influence of scattered radiation on materials’ effective attenuation coefficients at higher X-ray energies. The selected X-ray spectra for the dual-energy experiments correspond to 3 MV and 7.5 MV acceleration potential of the used betatron. Experiments were performed on a test phantom containing step wedges of different low- and high-Z materials. We evaluated the ratio between low- and high-energy X-ray attenuation coefficients quantitatively based on simulated poly-energetic high-energy X-ray source spectra and the detector sensitivity using the “analytical Radiographic Testing inspection simulation tool” (aRTist) developed at BAM. Furthermore, the influence of scattered radiation is evaluated using an efficient Monte-Carlo simulation. The simulation results are compared quantitatively with experimental investigations. Finally, important applications of the proposed technique in the context of aviation security are discussed.
X-ray backscatter imaging is a well established NDT technique to inspect complex objects using only a single-sided access. In difference to conventional transmission X-ray radiography, the X-ray backscatter imaging utilizes the scattered radiation caused by the Compton scattering effect. In order to achieve high backscatter intensities from a test object, it is necessary to optimize the backscatter system parameters namely the angle between source and slit camera, the slit collimator system, the shielding between source and scatter camera, and the type of detector. In addition, the scatter phenomena in to the investigated object need to be understood.
In this contribution, we present a Monte Carlo model McRay which considers all relevant single and multiple interactions of photons and electrons. This model can be used to simulate back scatter techniques. It allows not only calculating the scatter image for a given experimental setup but also registering the spectrum of the detected scattered photons. Both aspects are important to understand the imaging process, to interpret the results, and to optimize the backscatter camera investigated here. Additionally experimental results will be presented and compared with simulations.
One essential step on the way towards accurate quantitative simulation of radiographic testing is an accurate description of the utilized energy spectrum of X-ray photons. For use in general purpose simulation tools, the spectra of X-ray tubes have to be described by a model covering at least the intended range of applications. This range includes transmission tubes as well as direct beam tubes with varying angles of incidence and emission, for a number of typical target materials. In radiographic testing acceleration voltages frequently reach up to 450 kV for direct beam targets and up to 225 kV for transmission targets, with even higher voltages available or being developed. Currently used models are unable to cover the whole range of configurations.
Here a model is presented that employs a unified approach for simulating the photon energy spectra for transmission and direct beam targets composed of arbi-trary homogeneous materials. In order to achieve this, a detailed model of electron transport within the target is employed. The validity of the developed model is shown through comparisons with Monte Carlo simulations as well as measurements for a number of different configurations.
In this contribution, we discuss the influence of scattered radiation on materials’ effective attenuation coefficients at higher X-ray energies. The selected X-ray spectra for the dual-energy experiments correspond to 3 MV and 7.5 MV acceleration potential of the used betatron. Experiments were performed on a test phantom containing step wedges of different low- and high-Z materials. We evaluated the ratio between low- and high-energy X-ray attenuation coefficients quantitatively based on simulated poly-energetic high-energy X-ray source spectra and the detector sensitivity using the “analytical Radiographic Testing inspection simulation tool” (aRTist) developed at BAM. Furthermore, the influence of scattered radiation is evaluated using an efficient Monte-Carlo simulation. The simulation results are compared quantitatively with experimental investigations. Finally, important applications of the proposed technique in the context of aviation security are discussed.
X-ray backscatter imaging is a well established NDT technique to inspect complex objects using only a single-sided access. In difference to conventional transmission X-ray radiography, the X-ray backscatter imaging utilizes the scattered radiation caused by the Compton scattering effect. In order to achieve high backscatter intensities from a test object, it is necessary to optimize the backscatter system parameters namely the angle between source and slit camera, the slit collimator system, the shielding between source and scatter camera, and the type of detector. In addition, the scatter phenomena in to the investigated object need to be understood.
In this contribution, we present a Monte Carlo model McRay which considers all relevant single and multiple interactions of photons and electrons. This model can be used to simulate back scatter techniques. It allows not only calculating the scatter image for a given experimental setup but also registering the spectrum of the detected scattered photons. Both aspects are important to understand the imaging process, to interpret the results, and to optimize the backscatter camera investigated here. Additionally experimental results will be presented and compared with simulations.
Modelling becomes more and more important in modern NDE. It is increasingly used to optimize techniques for complex applications, to support the preparation of written procedures, and for education purposes. To describe the complete chain of RT, the model includes simulating all necessary properties of X- or Gamma-ray sources, the interaction of photons with material with special attention to scattered radiation, the detection process, and the complete geometrical RT setup handling arbitrary parts or constructions. Depending on the given inspection problem and the influencing factors that should be addressed by the simulation, an appropriate physical model has to be chosen to describe the underlying interaction mechanisms. The simulator aRTist combines analytical and Monte Carlo methods to efficiently model the radiation transport such that transmission as well as scatter techniques can be modelled. In this contribution we Focus on Monte Carlo Simulation of scatter contribution within aRTist. Examples for RT/tomographic applications and back-scatter techniques are presented to demonstrate the usability of the presented simulation tool for a broad range of radiological applications.
The new standard ISO 176362:2013 'NDT of welds: Radiographic testing - Part 2: X- and gamma ray techniques with digital detectors' describes a complex procedure for film replacement by phosphor imaging plates and digital detector arrays. RT modeling software should consider these detector types, X-ray film, and the standard requirements for image quality. Practitioners expect the same visibility of image quality indicators (IQI) in the simulated radiographs as in the experimental exposures. The proposed benchmark test is based on the comparison of experimental radiographs taken at BAM with modeled ones of participants. The experimental setup and the determination of the equivalent penetrameter sensitivity (EPS) as described in the procedure of ASTM E 746 are used for quantitative evaluation of the achievable contrast sensitivity for step hole IQIs as considered in Annex B of ISO 17636-2. System classification data for Computed Radiography (CR) and film systems will be provided by BAM according to ISO 116991 for selected film systems and according to ASTM E 2446 for selected CR systems. The classification of films and digital detectors is based on the measurement of the dose response function, the basic spatial resolution (SRb) of the image, and the measured image noise, which depends on the detector efficiency, the quantum statistics, and the detector fixed pattern noise.
Within the framework of the European project PICASSO, the radiographic simulator aRTist (analytical
Radiographic Testing inspection simulation tool) developed by BAM has been extended for reliability
assessment of film and digital radiography. A simulation supported probability of detection (POD) methodology
has been developed and the validity of the approach has been studied using an application from the aeronautics
industry. An experimental POD has been determined with the help of a specialized software tool, developed to
aid with the collection of large series of POD data. The resulting POD is compared to simulations of the same
setting using aRTist and the newly available module for simulation supported POD. A quantitative agreement
within a few percent is achieved between the experimental and the simulation supported POD.
A model is discussed which describes the generation of X-rays in conventional tubes using tabulated bremsstrahlung energy spectra depending on three variables: the target atomic number, the incident electron kinetic energy, and the fraction of energy radiated. Additionally a parameter-free description of the characteristic radiation is included. The constructed model includes technical tube parameters like kilovoltage, target material, and angles of electron incidence and photon emission to also account for self-absorption in the target, as well as radiographic parameters like filtering. In order to verify model results, detector response is also considered. The validity of the proposed model is shown by measurements. Future work includes the extension of the model to transmission targets. This research was supported by the German Federal Ministry of Economics and Technology under contract MNPQ transfer II D 5-30/06.