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- 2016 (2) (entfernen)
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- Chalcogenides (1)
- Defects (1)
- EBSD (1)
- Microstrain (1)
- Raman microspectroscopy (1)
- Semiconductors (1)
- Thin film (1)
- X-ray microdiffraction (1)
The device performance of polycrystalline chalcogenide thin film solar cells is strongly influenced by different kinds of defects within the material. The presence of sodium or other alkali metals like potassium during the deposition process is well known to influence the electronic properties of the solar cell and thus to improve the efficiency of the final device. Structural analysis of neutron powder diffraction data collected at low temperatures and subsequent profile analysis by the LeBail and Rietveld method demonstrates the impact of sodium on the point defect characteristics in off stoichiometric CuInSe2. The analyzed materials are powder and thin film solar absorber material with addition of NaF and free of sodium. It is illustrated, the so called “sodium effect” cannot be reduced to one single origin. A range of effects, the reduction of InCu donors with a followed increase of VCu acceptors is possible. The main effect is an increased ordered character of the chalcopyrite crystal structure at off stoichiometric composition, when containing sodium.
The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure–property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of the device. These defects are closely related to strain distributions. The present work compares electron and X-ray diffraction as well as Raman microspectroscopy, which provide access to microstrain distributions within individual grains. CuInSe₂ thin films or solar cells are used as a modelsystem. High-resolution electron backscatter diffraction and X-ray microdiffraction as well as Ramanmicrospectroscopy were applied for this comparison. Consistently, microstrain values were determined of the order of 10⁻⁴ by these three techniques. However,only electron backscatter diffraction, X-ray microdiffraction exhibit sensitivities appropriate for mapping local strain changes at the submicrometer level within individual grains in polycrystalline materials.