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For a long time, the rule of thumb for active thermography as a non-destructive testing method was that the resolution of internal defects/inhomogeneities is limited to a ratio of defect depth/defect size ≤ 1. This is due to the diffusive nature of thermal conduction in solids. So-called super resolution approaches have recently allowed this physical limit to be overcome many times over. This offers the attractive possibility of developing thermography from a purely near surface-sensitive testing method to one with improved depth range. How far this development can be pushed is the subject of current research.
We have already been able to show that this classical limitation for one- and two-dimensional defect geometries can be overcome by illuminating the test object sequentially in a structured manner with individual laser spots and thus subsequently calculating a defect map from the resulting measurement data by applying photothermal super resolution reconstruction, which allows significantly improved separation of individual closely spaced defects. As a result, this method benefits strongly from the combination of sequential spatially structured illumination and modern numerical optimization methods, which come at the expense of higher experimental complexity. This leads to long measurement times, large data sets, and tedious numerical analysis, in contrast to the application of established standard thermographic methods with homogeneous illumination.
In this work, we report on the application of full-area spatially structured two-dimensional illumination patterns, which, by applying state-of-the-art laser projector technology in conjunction with a high-power laser, makes it possible to achieve an efficient implementation of photothermal super-resolution reconstruction even for larger test areas in the first place.