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In this work, the limits of using spatially structured heating combined with subsequent photothermal super resolution reconstruction for the thermographic detection and resolution of internal defects are investigated. The approach is based on the application of modern high-power laser projector technology, which is used to repeatedly project varying spatially structured 2D pixel patterns to photothermally heat the object under test. After processing the generated thermographic data using nonlinear convex optimisation in conjunction with exploiting the joint-sparse nature of the defect signals within the individual measurements, a high-resolution 2D-sparse defect/inhomogeneity map is obtained. The main focus of the investigation is set on the influence of the number of individual measurements on the achievable reconstruction quality. Using numerical simulations based on an analytical representation of the forward solution to the underlying inverse problem, the convergence rate over performed measurements of the achievable reconstruction quality is determined. Finally, all findings are experimentally validated by reconstructing a set of internal defects in an additively manufactured sample. In this work, it is shown that for a variety of different defect separation distances, the projection of 50 different pixel patterns allows for a good trade-off between experimental complexity and reconstruction quality.
Subsurface defect localization by structured heating using laser projected photothermal thermography
(2017)
The presented method is used to locate subsurface defects oriented perpendicularly to the surface. To achieve this, we create destructively interfering thermal wave fields that are disturbed by the defect. This effect is measured and used to locate the defect. We form the destructively interfering wave fields by using a modified projector. The original light engine of the projector is replaced with a fiber-coupled high-power Diode laser. Its beam is shaped and aligned to the projector's spatial light modulator and optimized for optimal optical throughput and homogeneous projection by first characterizing the beam profile, and, second, correcting it mechanically and numerically. A high-performance infrared (IR) camera is set up according to the tight geometrical situation (including corrections of the geometrical image distortions) and the requirement to detect weak temperature oscillations at the sample surface. Data acquisition can be performed once a synchronization between the individual thermal wave field sources, the scanning stage, and the IR camera is established by using a dedicated experimental setup which needs to be tuned to the specific material being investigated. During data post-processing, the relevant information on the presence of a defect below the surface of the sample is extracted. It is retrieved from the oscillating part of the acquired thermal radiation coming from the so-called depletion line of the sample surface. The exact location of the defect is deduced from the analysis of the spatial-temporal shape of these oscillations in a final step. The method is reference-free and very sensitive to changes within the thermal wave field. So far, the method has been tested with steel samples but is applicable to different materials as well, in particular to temperature sensitive materials.