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Microstructural characterization of porous materials by two-dimensional X-ray refraction topography
(2004)
X-ray refraction topography determines the internal surfaces and interfaces of non-metallic porous materials within the range of namometer to micrometer dimensions. The method is based on refraction of X-rays caused by interfaces of microstructures in heterogeneous materials.
Generally, it permits a non-destructive full volume characterization of the pore topology. The X-ray refraction scanning technique make possible to visualize integral interface properties up to 10 μm spatial resolution by two-dimensional topographic images. It detects the spatially resolved internal surfaces of both, open and closed pores. Comparison to a certified powder reference of uniform grain size and known packing density reveals a quantitative measure for calibration requirements. An investigation on SiC- and Al2O3-ceramics illustrate the quantitative characterization of the internal surface density, pore sizes and their spatial distribution as well as local porosity fluctuations.
Subject of this investigation is the in-situ evolution of pore volume and pore size distribution in Ytong (a porous concrete material) under increasing pressure with two different non-destructive analytical methods: Nuclear Magnetic Resonance (NMR) and X-ray Computed Tomography (CT). For both methods special strain devices to apply external pressure were constructed. The results from the two techniques yield complementary information on the pore size distribution and allows covering different pore size regions.
The high-cycle fatigue, small crack propagation behavior of an A357-T6 cast aluminum alloy is investigated. Laboratory X-ray micro-computed tomography (μCT) is used to assist in the manufacturing of two flat fatigue specimens containing subsurface shrinkage pores of different sizes (Pore 1 √A=522μm against Pore 2 √A=280μm). Surface crack monitoring is performed by means of optical microscopy and the cracked specimens are analyzed via scanning electron microscopy and electron backscatter diffraction techniques. The subsurface pores tend to induce intergranular crack nucleation, principally when the grain boundaries are oriented perpendicular to the loading direction. Pore 1 induces a fatigue life reduction of 500.000 cycles when compared to Pore 2. The crystallography is able to influence small crack propagation by slightly decelerating the crack growth rates as well as by altering the crack path topography. Tailoring of the crystallography for improved fatigue resistance requires an investigation of the optimal largest defect to grain size ratio.