The charge of solid-liquid interfaces measured by X-ray standing waves and streaming current
- Measurements of ion distributions at a charged solid–liquid interface using X-ray standing waves (XSW) are presented. High energy synchrotron radiation (17.48 keV) is used to produce an XSW pattern inside a thin water film on a silicon wafer. The liquid phase is an aqueous solution containing Br and Rb ions. The surface charge is adjusted by titration. Measurements are performed over a pH range from 2.2–9, using the native Si oxide layer and functional (amine) groups as surface charge. The Debye length, indicating the extension of the diffuse layer, could be measured with values varying between 1–4 nm. For functionalized wafers, the pH dependent change from attraction to repulsion of an ion species could be detected, indicating the isoelectric point. In combination with the measurement of the streaming current, the surface charge of the sample could be quantified.
Autor*innen: | M. Brücher, A. von Bohlen, P. Jacob, J. Franzke, Martin RadtkeORCiD, Uwe Reinholz, Bernd R. MüllerORCiD, Oliver Scharf, R. Hergenröder |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | ChemPhysChem : a European journal of chemical physics and physical chemistry |
Jahr der Erstveröffentlichung: | 2010 |
Verlag: | Wiley-VCH Verl. |
Verlagsort: | Weinheim |
Jahrgang/Band: | 11 |
Ausgabe/Heft: | 10 |
Erste Seite: | 2118 |
Letzte Seite: | 2123 |
Freie Schlagwörter: | Interfacial charge; Solid/liquid interfaces; Standing waves; Streaming current; Surface analysis; Surface functionalization; Synchrotron radiation; X-ray; X-ray spectrometry; XSW |
DOI: | 10.1002/cphc.201000166 |
ISSN: | 1439-4235 |
ISSN: | 1439-7641 |
Verfügbarkeit des Dokuments: | Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access") |
Bibliotheksstandort: | Sonderstandort: Publica-Schrank |
Datum der Freischaltung: | 19.02.2016 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 07.10.2010 |