• Treffer 2 von 7
Zurück zur Trefferliste

Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites

  • Beyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspectsBeyond measuring the topography of surfaces, scanning force microscopy (SFM) has proved to be valuable both for mapping of various materials properties and for modifying surfaces via lithography techniques. Thus, SFM has gained relevance as a surface analysis technique as well as a tool for nanoscale engineering purposes. Different kinds of tip-sample interactions are exploitable, e.g. mechanical, thermal and electrical ones. Owing to its versatility, SFM has found plenty of applications in polymer science. Among others, the examples reported on in this review article encompass issues related to commodity polymers, various polymer-based composites, polymer blends, or ferroelectric polymers. For instance, stiffness imaging is elucidated as a technique for detecting interphases occurring in composites with inorganic fillers. The described applications are mainly related to mechanical and electrical tip-sample interactions. The respective fundamentals are outlined as well as some aspects of the measurement of materials contrasts. The presented techniques of nano-scale modification are a dynamical sort of plowing lithography and electrical poling, both performed by means of SFM-probes.zeige mehrzeige weniger

Metadaten exportieren

Weitere Dienste

Teilen auf Twitter Suche bei Google Scholar Anzahl der Zugriffe auf dieses Dokument
Metadaten
Autor*innen:Martin Munz, Brunero CappellaORCiD, Heinz SturmORCiD, Markus Geuss, Eckhard Schulz
Dokumenttyp:Beitrag zu einem Sammelband
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Filler-reinforced elastomers scanning force microscopy
Jahr der Erstveröffentlichung:2003
Verlag:Springer
Verlagsort:Berlin
Ausgabe/Heft:164
Erste Seite:87
Letzte Seite:210
Freie Schlagwörter:Contact mechanics; Electrical properties; Ferroelectric domain-walls; Interface/interphase; Interfacial shear-strength; Local electrical-properties; Maxwell-stress microscopy; Microscopy (SFM/AFM) thermal diffusivity; Modulated friction techniques; Nanolithography; Nanometer-scale modification; Polymer-matrix composites (PMC) scanning/atomic force; Probing micromechanical properties; Self-assembled monolayers; Solid-liquid interfaces; Spreading resistance microscopy
DOI:10.1007/b11055
ISSN:0065-3195
ISSN:1436-5030
ISBN:3-540-00530-7
Bemerkung:
Serientitel: Advances in polymer science – Series title: Advances in polymer science
Verfügbarkeit des Dokuments:Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")
Bibliotheksstandort:Mk 526
Bibliotheksstandort:Za 046/164
Datum der Freischaltung:19.02.2016
Referierte Publikation:Nein
Einverstanden
Diese Webseite verwendet technisch erforderliche Session-Cookies. Durch die weitere Nutzung der Webseite stimmen Sie diesem zu. Unsere Datenschutzerklärung finden Sie hier.