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Ratzke, Markus
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MBE-based growth of Sn-rich quantum wells and dots at low Sn deposition rates
(2023)
Hayat, Ahsan
;
Spirito, Davide
;
Corley-Wiciak, Agnieszka Anna
;
Schubert, Markus Andreas
;
Masood, Maria
;
Reichmann, Felix
;
Ratzke, Markus
;
Capellini, Giovanni
;
Fischer, Inga Anita
Pulsed laser deposition of hafnium oxide on silicon
(2005)
Kappa, Mathias
;
Ratzke, Markus
;
Reif, Jürgen
Pulsed laser deposition of HfO2 and Pr(x)O(y) high-k films on Si(100)
(2005)
Ratzke, Markus
;
Wolfframm, Dirk
;
Kappa, Mathias
;
Kouteva-Arguirova, Simona
;
Reif, Jürgen
Morphology and Composition of Praseodymium Based High-k Materials and Their Relevance to Dielectric Properties of Thin-Films
(2007)
Lippert, Gunther
;
Dabrowski, Jarek Marek
;
Costina, Ioan
;
Lupina, Grzegorz
;
Ratzke, Markus
;
Zaumseil, Peter
;
Müssig, Hans-Joachim
Feedback Effect on the Self-Organized Nanostructures Formation on Silicon upon Femtosecond Laser Ablation
(2009)
Varlamova, Olga
;
Ratzke, Markus
;
Reif, Jürgen
Multipulse feedback in self-organized ripples formation upon femtosecond laser ablation from silicon
(2010)
Reif, Jürgen
;
Varlamova, Olga
;
Ratzke, Markus
;
Schade, Martin
;
Leipner, Hartmut S.
;
Arguirov, Tzanimir V.
Fixed charge densitiy distribution on pulsed laser deposited high-k oxide layers
(2008)
Ratzke, Markus
;
Yang, B.
;
Reif, Jürgen
Scanning Probe studies of the electrical activity at interfaces formed by silicon wafer direct bonding
(2007)
Ratzke, Markus
;
Yu, Xuegong
;
Vyvenko, Oleg F.
;
Reif, Jürgen
;
Kittler, Martin
;
Reiche, Manfred
On the reliability of scanning probe based electrostatic force measurements
(2007)
Ratzke, Markus
;
Reif, Jürgen
Control parameters in pattern formation upon femtosecond laser ablation
(2007)
Varlamova, Olga
;
Costache, Florenta Adriana
;
Ratzke, Markus
;
Reif, Jürgen
PLD of high-k dielectric films on silicon
(2004)
Ratzke, Markus
;
Kappa, Mathias
;
Wolfframm, Dirk
;
Kouteva-Arguirova, Simona
;
Reif, Jürgen
Pulsed laser deposition of Praseodymium Oxide films on Silicon (100)
(2004)
Ratzke, Markus
;
Wolfframm, Dirk
;
Arguirov, Tzanimir V.
;
Kappa, Mathias
;
Reif, Jürgen
Pulsed Laser Deposition of Thin PrxOx Films on Si(100)
(2004)
Wolfframm, Dirk
;
Ratzke, Markus
;
Kappa, Mathias
;
Montenegro, M. J.
;
Döbeli, M.
;
Lippert, Th.
;
Reif, Jürgen
Rapid dislocation-related D1-photoluminescence imaging of multicrystalline Si wafers at room temperature
(2011)
Schmid, Reiner P.
;
Mankovics, Daniel
;
Arguirov, Tzanimir V.
;
Ratzke, Markus
;
Mtchedlidze, T.
;
Kittler, Martin
Growth process of microcrystalline silicon studied by combined photoluminsescence and Raman investigations
(2013)
Klossek, Andre
;
Mankovics, Daniel
;
Arguirov, Tzanimir V.
;
Ratzke, Markus
;
Kirner, Simon
;
Friedrich, Felice
;
Gabriel, Onno
;
Stannowski, Bernd
;
Schlatmann, Rutger
;
Kittler, Martin
Laser-Induced Periodic Surface Structures of Thin Complex Multi-Component Films
(2016)
Reif, Jürgen
;
Varlamova, Olga
;
Ratzke, Markus
;
Uhlig, Sebastian
On large area LIPSS coverage by multiple pulses
(2015)
Reif, Jürgen
;
Martens, Christian
;
Uhlig, Sebastian
;
Ratzke, Markus
;
Varlamova, Olga
;
Valette, Stephane
;
Benayoun, Stephane
Scanning Kelvin probe and photoemission electron microscopy of organic source-drain structures
(2004)
Müller, K.
;
Goryachko, Andriy
;
Burkov, Yevgen
;
Schwiertz, Carola
;
Ratzke, Markus
;
Köble, J.
;
Reif, Jürgen
;
Schmeißer, Dieter
Genesis of femtosecond-induced nanostructures on solid surfaces
(2014)
Varlamova, Olga
;
Martens, Christian
;
Ratzke, Markus
;
Reif, Jürgen
Kraftmikroskopie als Werkzeug zur Charakterisierung elektrischer Oberflächeneigenschaften
(2012)
Ratzke, Markus
1
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20
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