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Institution name at the time of publication
Fakultät für Mathematik, Naturwissenschaften und...
LS Leichtbau-Keramik
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Schmid, Reiner P.
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Reif, Jürgen
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Arguirov, Tzanimir V.
(3)
Wolfframm, Dirk
(3)
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(2)
Mankovics, Daniel
(2)
Mtchedlidze, T.
(2)
Muth, Marco
(2)
Schneider, Thomas
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AG Physikalische Chemie II
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an der BTU erstellt / created at BTU
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Title
Author
Author
Hafnium oxide on silicon: A non-destructive characterization of the interfacial layer
(2004)
Wolfframm, Dirk
;
Kouteva-Arguirova, Simona
;
Arguirov, Tzanimir V.
;
Schmid, Reiner P.
;
Dittmar, K.
;
Zienert, I.
;
Reif, Jürgen
Einfache Methode zur Steigerung der Empfindlichkeit in Null-Ellipsometrie
(2013)
Muth, Marco
;
Schmid, Reiner P.
;
Schnitzlein, Klaus
Specific modifications to enhance sensitivity in null-ellipsometry
(2014)
Muth, Marco
;
Schmid, Reiner P.
;
Schnitzlein, Klaus
Novel imaging techniques for dislocation-related D1-photo-luminescence of multicrystalline Si wafers - two different approaches
(2011)
Schmid, Reiner P.
;
Mankovics, Daniel
;
Arguirov, Tzanimir V.
;
Mtchedlidze, T.
;
Kittler, Martin
Rapid dislocation-related D1-photoluminescence imaging of multicrystalline Si wafers at room temperature
(2011)
Schmid, Reiner P.
;
Mankovics, Daniel
;
Arguirov, Tzanimir V.
;
Ratzke, Markus
;
Mtchedlidze, T.
;
Kittler, Martin
Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress
(2000)
Reif, Jürgen
;
Schneider, Thomas
;
Schmid, Reiner P.
;
Wolfframm, Dirk
Efficient instantaneous optical switching, frequency conversion and simple logic operations on a femtosecond time scale
(2003)
Reif, Jürgen
;
Schmid, Reiner P.
Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress
(2000)
Reif, Jürgen
;
Schmid, Reiner P.
;
Schneider, Thomas
;
Wolfframm, Dirk
1
to
8
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