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Pomplun, Jan
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Schmidt, Frank
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finite element method
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reduced basis method
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electromagnetic field solver
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optical metrology
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rigorous optical modeling
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adaptive sampling
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maxwell equation
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model reduction
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Determination of line profile on nanostructured surfaces using EUV and x-ray scattering
(2014)
Soltwisch, Victor
;
Wernecke, Jan
;
Haase, Anton
;
Probst, Jürgen
;
Schoengen, Max
;
Scholze, Frank
;
Pomplun, Jan
;
Burger, Sven
Finite-element based electromagnetic field simulations: Benchmark results for isolated structures
(2013)
Burger, Sven
;
Zschiedrich, Lin
;
Pomplun, Jan
;
Schmidt, Frank
Finite element simulation of optical modes in VCSELs
(2011)
Pomplun, Jan
;
Burger, Sven
;
Rozova, Maria
;
Zschiedrich, Lin
;
Schmidt, Frank
Finite elements for nano-optics applications
(2016)
Zschiedrich, Lin
;
Schmidt, Frank
;
Pomplun, Jan
;
Burger, Sven
Impact of topographic mask models on scanner matching solutions
(2014)
Tyminski, Jacek
;
Pomplun, Jan
;
Renwick, Stephen P.
Efficient optimization of hollow-core photonic crystal fiber design using the finite-element method
(2006)
Holzlöhner, Ronald
;
Burger, Sven
;
Roberts, P.
;
Pomplun, Jan
Fast online inverse scattering with Reduced Basis Method (RBM) for a 3D phase grating with specific line roughness
(2011)
Kleemann, B.
;
Kurz, J.
;
Hetzler, J.
;
Pomplun, Jan
;
Burger, Sven
;
Zschiedrich, Lin
;
Schmidt, Frank
Accelerated a posteriori error estimation for the reduced basis method with application to 3D electromagnetic scattering problems
(2010)
Pomplun, Jan
;
Schmidt, Frank
Reduced basis method for fast and robust simulation of electromagnetic scattering problems
(2009)
Pomplun, Jan
;
Schmidt, Frank
Reduced basis method for computational lithography
(2009)
Pomplun, Jan
;
Zschiedrich, Lin
;
Burger, Sven
;
Schmidt, Frank
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